LiteScope™

Scanning Probe Microscope designed for easy integration into the Scanning Electron Microscopes.

Explore a brand new Correlative Probe and Electron Microscopy technique.

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The LiteScope™ microscope

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Correlative Probe and Electron Microscopy (CPEM)

The CPEM technology is the first solution on the market which enables to measure the SPM and SEM on the same place, same time using the same coordination system.

 

Simple probe exchange

The LiteScope™ offers easy and swift replacement of probes and samples. Significant advantage is also simple SEM mounting/dismounting in less than five minutes.

 

A wide range of imaging modes for SPM

The LiteScope™ incorporates a wide range of SPM imaging modes, such as STM, cAFM, ncAFM, EFM, MFM, KPFM and others which can be easily used by means of replaceable probes.

NenoVision introduces the unique CPEM technique

Correlative Probe and Electron Microscopy (CPEM) has been developed for application in Correlative Imaging (patent pending).

SEM technology

SEM technology

Scanning the sample by means of electrons for 2D analysis.

SPM technology

SPM technology

Scanning the sample by means of a physical probe.

CPEM technology

CPEM technology

Combining both techniques to provide unique correlative imaging.

Applications

Materials science and Nanotechnology

Materials science and Nanotechnology

The LiteScopeTM provides expected 3D characterization.

Quality control and Research & Development

Quality control and Research & Development

The LiteScopeTM offers characteristic of milled surface by FIB or GIS deposition.

Semiconductors, solar cells, memory devices, MEMS & NEMS

Semiconductors, solar cells, memory devices, MEMS & NEMS

The LiteScopeTM helps analyse surface structures and nano-devices.

News

NenoVision holds a workshop on LiteScope SPM/SEM integration

2017-06-21

Nenovison will present new measurement techniques for the true correlative imaging which enable direct comparison of the images from SEM and SPM. In the second half participants will have a chance to see LiteScope directly operated in the CEITEC Nano facilities. New possibilities of the correlative microscopy by CPEM will be introduced on June 27, 2017 in CEITEC BUT at 10:00. For more information see CEITEC.

NenoVision is one of proud sponsors of EUFN Workshop in Graz *

2017-04-29

Following 11 highly successful D-A-CH FIB workshops, the 1st EUFN Workshop will be held from July 4-5, 2017 in Graz, Austria and NenoVision cannot miss it. We will present technical and application news of the LiteScope. Use the opportunity to meet us and get more information about LiteScope, the CPEM technology and how you can use it in your research. 

Meet us at TechConnect conference in Washington

2017-04-27

During May 14-17, 2017 the NenoVision company will be present at one of the greatest world conferences dedicated to innovations. Meet us at stand 318 at the largest expo built specifically for the global innovation community and discuss what we can bring to your projects.

More information can be found at www.technoconnectworld.com

* Source: SEM images by FEI company