LiteScope™

Scanning Probe Microscope designed for easy integration into the Scanning Electron Microscopes.

Explore a brand new Correlative Probe and Electron Microscopy technique.

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The LiteScope™ microscope

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Correlative Probe and Electron Microscopy (CPEM)

The CPEM technology is the first solution on the market which enables to measure the SPM and SEM on the same place, same time using the same coordination system.

 

Simple probe exchange

The LiteScope™ offers easy and swift replacement of probes and samples. Significant advantage is also simple SEM mounting/dismounting in less than five minutes.

 

A wide range of imaging modes for SPM

The LiteScope™ incorporates a wide range of SPM imaging modes, such as STM, cAFM, ncAFM, EFM, MFM, KPFM and others which can be easily used by means of replaceable probes.

NenoVision introduces the unique CPEM technique

Correlative Probe and Electron Microscopy (CPEM) has been developed for application in Correlative Imaging (patent pending).

SEM technology

SEM technology

Scanning the sample by means of electrons for 2D analysis.

SPM technology

SPM technology

Scanning the sample by means of a physical probe.

CPEM technology

CPEM technology

Combining both techniques to provide unique correlative imaging.

Applications

Materials science and Nanotechnology

Materials science and Nanotechnology

The LiteScopeTM provides expected 3D characterization.

Quality control and Research & Development

Quality control and Research & Development

The LiteScopeTM offers characteristic of milled surface by FIB or GIS deposition.

Semiconductors, solar cells, memory devices, MEMS & NEMS

Semiconductors, solar cells, memory devices, MEMS & NEMS

The LiteScopeTM helps analyse surface structures and nano-devices.

News

International biennial ‘Nanomaterials and Nanotechnology Meeting’ is another opportunity to explore great features of the LiteScope

2017-04-20

Meet us on May 22-25 2017 in Ostrava during Nanomaterials and Nanotechnology Meeting, the symposium that will be a platform to facilitate open discussions between scientists, students and representatives from companies with an interest in the development of nanomaterials and nanotechnology.

Lecture about CPEM technology delivered at Applied Mechanics conference

2017-03-29

During international Applied Mechanics conference on April 25-27, 2017 you can listen to NenoVision CEO, Jan Neuman, delivering a lecture about the LiteScope and the unique CPEM technology. Use the opportunity to get more information about Correlative microscopy, an approach that benefits from the imaging of the same object by two different techniques. 

LiteScope will be introduced at Near-field methods workshop in Lednice

2017-02-18

If you would like to become more familiar with the LiteScope and possible application for your projects do not miss the next bi-annual SPM workshop that will take place between 29th and 31st March 2017 in Lednice, Czech Republic.

* Source: SEM images by FEI company