Application notes

In this section can be found information about our new measurements made by our application specialist on different types of samples as well as description of applied technologies that have been used.

 

NewsLetter

CPEM Correlative Probe and Electron Microscopy™

CPEM Correlative Probe and Electron Microscopy™

Correlative microscopy enables
a new insight into imaging of the
nanoworld. SPM LiteScope™
brings a revolutionary approach
into this subject. With LiteScope™
 

Failure Analysis of Integrated Circuits by SPM/FIB/SEM - Delayering

Failure Analysis of Integrated Circuits by SPM/FIB/SEM - Delayering

Integration of SPM/FIB/SEM techniques significantly
simplify delayering process used for failure analysis,
quality control and R&D of integrated circuits.

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