Scanning Probe Microscope designed for easy integration into the Electron Microscopes. The combination of complementary SPM and SEM techniques enables to use the advantages of both commonly used microscopy techniques.
This probe is based on a quartz tuning fork combined with a micro-machined cantilever.
The great advantage of this novel probe is that user can benefit from both the tuning fork’s extremely stable oscillation and the silicon cantilever’s reasonable spring constant with one probe.
Provided by NANOSENSORS
Piezo-Resistive Sensing Active (PRSA) probes are silicon cantilevers with an integrated piezo-resistor bridge and a thermal heater for self-sensing and self-actuating scanning probe microscopy applications.
The piezo-resistors are integrated into a matched Wheatstone bridge to optimize the sensitivity and compensate for environmental thermal drift.
Provided by SCL-Sensor.Tech. Fabrication GmbH
The quartz tuning fork is used for detection of atomic forces between tip and surface. The high stiffness of the tuning fork enables very low oscillation amplitudes while the high Q-factor ensures sufficient sensitivity. The probe may have a conductive tip that may be connected to the electronic readout (for conductive AFM or tunneling current readout) without cross-talk with the fork electrodes. The magnetic properties of a sample may also be examined by means of tuning fork sensors with ferromagnetic tips. Further, tuning fork sensors may be constructed by the experienced end-user using various tip materials to tune for the desired properties.
Conductive wire is a basic probe for STM measurements.
Although Pt/Ir alloy is one of the easiest to use for this purpose, many other materials may be utilized (e.g. gold, molybdenum, nickel, etc.). Wire may be both electrochemically etched or mechanically cut to form a very sharp tip. Such a probe is also suited to local voltage / current measurement in nanomanipulator mode.