The LiteScope™ is of great interest to the participants of the international fair "NANOCON 2017"

2017-10-19

Visitors to the international fair are very interested in our product, which is a great pleasure for us.

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Tomorrow we have the opportunity to visit our lecture Jan Neuma, Ph.D. He will talk about the principle of measurement and use examples.

Take the invitation to the lecture:

10:30 - 10:45 CONFERENCE HALL BETA (A40)

NEUMAN Jan, Ph.D. (NenoVision s.r.o., Brno, Czech Republic, EU) - LiteScope – AFM Extension for SEM as a Tool for Nanoscience and Unique Correlative Probe and Electron Microscopy (CPEM) Technique 

For details about the conference please refer to www.nanocon.eu