Visitors to the international fair are very interested in our product, which is a great pleasure for us.
Tomorrow we have the opportunity to visit our lecture Jan Neuma, Ph.D. He will talk about the principle of measurement and use examples.
Take the invitation to the lecture:
10:30 - 10:45 CONFERENCE HALL BETA (A40)
NEUMAN Jan, Ph.D. (NenoVision s.r.o., Brno, Czech Republic, EU) - LiteScope – AFM Extension for SEM as a Tool for Nanoscience and Unique Correlative Probe and Electron Microscopy (CPEM) Technique
For details about the conference please refer to www.nanocon.eu