Visit us at the conference MICROSCOPY 2020 which will be held on 6 – 7 October in Lednice na Moravě, the Czech Republic.
You are welcome to stop by at our booth and discover the advantages of AFM-in-SEM approach. Moreover, our Senior Application Engineer Josef Horák will be having a presentation on AFM-in-SEM LiteScope: The novel approach to correlative microscopy and surface characterization. Don't miss the chance to discuss your application and explore what benefits can we bring to you research. Contact us for more information at firstname.lastname@example.org.
See you there!
More information can be found here: Konference Mikroskopie 2020