During international Applied Mechanics conference on April 25-27, 2017 you can listen to NenoVision CEO, Jan Neuman, delivering a lecture about the LiteScope and the unique CPEM technology. Use the opportunity to get more information about Correlative microscopy, an approach that benefits from the imaging of the same object by two different techniques.
CPEM (Correlative Probe and Electron Microscopy) enables simultaneous detection and acquisition of AFM and SEM signals at the same time and in the same place.
Scanning sample by means of electrons for 2D analysis.
Scanning sample by means of a physical probe.
Combines both techniques and provides unique correlative imaging.