LiteScope will be introduced at Near-field methods workshop in Lednice
If you would like to become more familiar with the LiteScope and possible application for your projects do not miss the next bi-annual SPM workshop that will take place between 29th and 31st March 2017 in Lednice, Czech Republic.
NenoVision is a proud sponsor of this workshop and its representatives will introduce there the LiteScope using the unique Correlative Probe and Electron Microscopy (CPEM) technology as the first solution on the market which enables to measure the SPM and SEM on the same place, same time using the same coordination system.
Reach us and explore personally the unique advantages of integration SPM and SEM techniques.
SEM technology
Scanning sample by means of electrons for 2D analysis.
AFM technology
Scanning sample by means of a physical probe.
CPEM technology
Combines both techniques and provides unique correlative imaging.
Company address
NenoVision s.r.o.
Purkyňova 649/127
612 00 Brno
Czech Republic
VAT: CZ04525671
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