Prof. Dr. Ehrenfried Zschech

Jan Neuman provided an impressive talk at the E-MRS European Nanoanalysis Symposium 2020. He presented numerous examples of correlative microscopy applying NenoVison's AFM-in-SEM system. Considering the wide range of measuring modes this system is offering, NenoVision will open the door to correlative materials characterization. I am convinced that researchers in Physics, Chemistry, Materials Science, and Life Science will benefit from this innovative product.

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