Prof. Wouter Metsola van der Wijngaart

We have greatly appreciated every aspect of our collaboration with NenoVision. Our communication has been smooth, efficient, and informative. By utilizing their novel CPEM technology, NenoVision helped us gain unique 3D information about our nano-sized samples deposited on cm-sized substrates. The unique ability to utilize both SEM and AFM at the same time allowed us to directly correlate the size and mechanical properties of silk nanowires. We truly appreciated all the assistance we received from NenoVision and hope to continue this fruitful collaboration in the future.

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