RNDr. Jan Kunc, Ph.D.

The correlative AFM and SEM imaging enabled us to easily identify graphene nanoribbons on nonpolar meso structures of SiC. Although we could measure the topography using a stand-alone AFM, we would not be able to localize the graphene nanoribbon. While the SEM imaging enables us to identify the presence of the graphene ribbon from the changes in the surface conductivity, the AFM is used to localize the area of the SiC terrace where the ribbon was formed. Merging of the AFM and SEM techniques enables us to reliably localize the nanoribbons and to estimate the optimal growth conditions.

Kunc Jan_circle