In this section can be found information about our new measurements made by our application specialist on different types of samples as well as description of applied technologies that have been used.
Correlative microscopy enables
a new insight into imaging of the
nanoworld. AFM LiteScope™
brings a revolutionary approach
into this subject.
Integration of SPM/FIB/SEM techniques significantly
simplify delayering process used for failure analysis,
quality control and R&D of integrated circuits.
In case of any question, please, do not hesitate to: