Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.
Correlative microscopy is an approach that benefits from the imaging of the same object by two different techniques.
Correlative Probe and Electron Microscopy (CPEM) has been developed for the application using Correlative Imaging (patented) and brings the solution, which synchronizes:
CPEM technology is the first of its kind on the market to allow measurement of AFM and SEM in the same place and at the same time using the same coordination system.
Scanning sample by means of electrons for 2D analysis.
Scanning sample by means of a physical probe.
Combines both techniques and provides unique correlative imaging.
CPEM enables simultaneous surface characterization of one area by SEM and AFM at the same time and in the same coordination system.
Simultaneous scanning with known constant offset and identical resolution ensures that the analysis is performed on the same surface and can be used directly for online imaging via our NenoView software.