LiteScope™
Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.
Description
The LiteScope™ provides a wide range of Scanning Probe Microscopy (SPM) imaging modes, which can be easily used via replaceable probes.
Comprehensive sample analysis including:
- characterization of surface topography
- mechanical properties
- electrical properties
- magnetic properties
The LiteScope™ may also be combined with other SEM accessories:
- Focused Ion Beam (FIB)
- Gas Injection System (GIS)
for fabrication of nano/microstructures and surface modifications. In this combination, the LiteScope™ offers easy and fast 3D inspection of manufactured structures.
Do you have more questions?
contact us
Company address
NenoVision s.r.o.
Purkyňova 649/127
612 00 Brno
Czech Republic
VAT: CZ04525671
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