Scanning Probe Microscope designed for easy integration into the Electron Microscopes. The combination of complementary SPM and SEM techniques enables to use the advantages of both commonly used microscopy techniques.
LiteScope™ is usually used in high vacuum, but may also be adapted for ultra high vacuum conditions on request.
We offer fully non magnetic version and also closed loop on request.
The LiteScope™ is placed on the stage of an SEM/FIB microscope and is able to measure even in tilted position, for example for simultaneous usage with FIB technique.
All electronics running LiteScope™ is integrated into one control unit. This unit is a standard 19” rack and may easily be mounted on the free slot of SEM electronics or simply positioned free to match the needs of the task in hand.
NenoView is user-friendly software, which allows to fully control the set-up measurements, data acquisition and data processing. NenoView supports CPEM technology and enables it to utilize correlative imaging directly and internally.