LiteScope™

LiteScope™ Data

LiteScope™ is usually used in high vacuum, but may also be adapted for ultra high vacuum conditions on request.

• Operating temperature: +15 °C to +25 °C
• Standard operating pressure: 10^-5 Pa to 10⁵ Pa
• Overall dimensions: 129 mm x 90 mm x 45-55 mm
• Total weight: 650 g
• Maximal scanned sample area: 22 mm x 11 mm x 8 mm
• Scanner range: 100 um x 100 um x 100 um
• Resolution: 0.2 nm

We offer fully non magnetic version and also closed loop on request.

Design

The LiteScope™ is placed on the stage of an SEM/FIB microscope and is able to measure even in tilted position, for example for simultaneous usage with FIB technique.

• Low profile and small size enables integration within SEM/FIB instruments
• Easy integration procedure – mounting on the SEM/FIB manipulator
• Docking option when the whole SPM probe is hidden within the body of LiteScopeTM
• Universal probe holder suitable for several SPM methods and easy “Plug & Play” assembly
• Sample tilt up to 60°
• Optimized mechanical design with respect to low vibration level (stiffness and appropriate resonance frequency), integrated preamplifier (to eliminate signal distortion / noise as much as possible)

Control unit

All electronics running LiteScope™ is integrated into one control unit. This unit is a standard 19” rack and may easily be mounted on the free slot of SEM electronics or simply positioned free to match the needs of the task in hand.

• Maximum PLL frequency for dynamic measurements 75 kHz suitable for tuning fork based probes (or higher using external PLL or to customer requirement)
• 2× 16-bit DAC per scan axis to reach maximal resolution everywhere within the view field
• 5× 16 bit auxiliary inputs for simultaneous measurements of user signals (±10 V)
• Input signals may be employed in four channel feedback-loop mixer
• External probe excitation
• Ethernet connection
• The preamplifier is situated within the body of the LiteScope™, ensuring significant reduction of electrical interference

NenoView Software

NenoView is user-friendly software, which allows to fully control the set-up measurements, data acquisition and data processing. NenoView supports CPEM technology and enables it to utilize correlative imaging directly and internally.

• Saves the data with all the information including measurement setup
• Web based user interface
• Easy for new users, flexible for experts
• User accounts individually configurable
• Remote access to user data
• Download of data from control PC to local computer
• Remote experiment control via tablet, smartphone etc.
• Integrated data postprocessing, analyses, export etc.