Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.
LiteScope™ supports a variety of self-sensing probes through proprietary probe holders.
LiteScope is not limited by the use of proprietary AFM probes but supports a broad variety of self-sensing probes from other manufacturers through appropriate probe holders. AFM probe can be easily inserted into the appropriate probe holder and then attached to the LiteScope’s universal holder acceptor – no screws or tools required.
Tuning fork-based probes
The use of quartz crystal tuning fork for AFM application is based on the effect of high-Q resonance detuning when the tip mounted on the oscillating quartz approaches the surface. Tuning fork-based probes possess many advantageous properties such as high stiffness, stable oscillation, direct electrical actuation, and low-cost.
Silicon cantilevers with an integrated piezo‐resistor are available in many different specifications suitable for various applications.
PRSA - with an integrated piezo-resistor bridge and a thermal heater for self-sensing and self-actuating.
PRS - with an integrated piezo-resistor bridge, without a thermal heater
Basic probe for STM and local voltage/current measurement in nano manipulator mode.
|Material mechanical properties||Application||Probe|
|Atomic Force Microscopy (AFM)||topography||Akiyama, PRSA|
|Energy dissipation||local elastic properties (tapping mode)||Akiyama|
|Force Modulation Microscopy (FMM)||local elastic properties (contact mode)||PRSA|
|Force-distance curves||local elastic properties (non-topographic)||PRSA|
|Nanoindentation||depth-dependent material characterization||PRSA|
|Nanomanipulation||various in-situ operations||Akiyama, PRSA|
|Conductive AFM (C-AFM)||conductivity map||NenoProbe|
|Conductive CPEM (C-CPEM)||conductivity map including insulated areas||NenoProbe|
|Kelvin Probe Force Microscopy (KPFM)||local surface potential||NenoProbe|
|Electrical spectroscopy||local electrical properties (non-topographic)||NenoProbe|
|Scanning Tunneling Microscopy||Sub-nanometer topography||Pt-Ir wire|
|Piezoresponse Force Microscopy (PFM)||piezoelectric domain imaging||NenoProbe|
NenoCase™ is a new accessory for an Atomic Force Microscope LiteScope™.
NenoCase is not only a user-friendly storage case but it also brings new possibilities that allow LiteScope to perform as a stand-alone device. It incorporates a passive anti-vibration system to ensure high-quality imaging outside the SEM chamber.
NenoCase can be purged with different gases used for measurements under different atmospheres.
NenoCase with camera
A digital camera with a custom-made stand is an optional NenoCase accessory that allows precise optical AFM tip navigation on the sample surface. The camera control is integrated directly into the NenoView software which enables long working distance.
LiteScope load-lock mechanism provides the possibility of loading samples and probes into LiteScope using a standard SEM air-lock / load-lock sample transfer system.
Load lock is an optional accessory for LiteScope, which enables quick and easy sample and/or AFM probe exchange without the need for disrupting the high vacuum in the SEM chamber.
The semi-automatic loading system consists of two adaptation arms:
Key Features/ Advantages
LiteScope is compatible with many standard SEM stubs; nevertheless, custom stubs, sample holders or a variety of specialized tools can be tailored for specific AFM-in-SEM applications.
AFM-in-SEM approach gives an access to measurements and applications that were not possible with separate AFM and SEM systems. All the way from heated/cooled stage for e.g. life-science applications to micro tensile tester for e.g. characterization of metals – let us know about your requirements to be able to take full advantage of the AFM-in-SEM concept.