LiteScope™

Tuning fork-based probes

The use of quartz crystal tuning fork for AFM application is based on the effect of high-Q resonance detuning when the tip mounted on the oscillating quartz approaches the surface. Tuning fork-based probes possess many advantageous properties such as high stiffness, stable oscillation, direct electrical actuation, and low-cost.

Piezo-resistive probes

Silicon cantilevers with an integrated piezo‐resistor are available in many different specifications suitable for various applications. 

PRSA - with an integrated piezo-resistor bridge and a thermal heater for self-sensing and self-actuating.

PRS - with an integrated piezo-resistor bridge, without a thermal heater

Conductive wire

Basic probe for STM and local voltage/current measurement in nano manipulator mode.

NenoCase

NenoCase™ is a new accessory for an Atomic Force Microscope LiteScope™.

NenoCase is not only a user-friendly storage case but it also brings new possibilities that allow LiteScope to perform as a stand-alone device. It incorporates a passive anti-vibration system to ensure high-quality imaging outside the SEM chamber.

NenoCase can be purged with different gases used for measurements under different atmospheres.

Key Features

• Storage of LiteScope in vacuum or desiccated environment to eliminate unwanted water adsorption during the storage out of SEM.
• LiteScope full operation outside of SEM in vacuum or various atmospheres.
• Equipped with passive vibration protection.
• Possibility of using controlled atmosphere such as N2, Ar, etc.
• Adjustable platform level.
• The transparent design of the top cover allows the use of an optical or stereomicroscope to find structures or tip navigation.

LiteScope load-lock mechanism provides the possibility of loading samples and probes into LiteScope using a standard SEM air-lock / load-lock sample transfer system. ​

Load lock is an optional accessory for LiteScope, which enables quick and easy sample and/or AFM probe exchange without the need for disrupting the high vacuum in the SEM chamber.

The semi-automatic loading system consists of two adaptation arms:

• The sample loading adaptor enables to load samples directly into LiteScope scan head by manual SEM transfer arm movement.
• The probe loading adaptor enables to conveniently exchange the probe together with the probe holder.

Key Features/ Advantages​

• Time reduction for sample/probe exchange​
• No need to open and vent SEM chamber for sample or probe exchange​
• Simple operation via NenoView SW
• Usable with standard manual SEM Air-lock / Load-lock systems​
• Semi-Automatic loading/unloading of ​samples​ and variety of AFM probes​

LiteScope is compatible with many standard SEM stubs; nevertheless, custom stubs, sample holders or a variety of specialized tools can be tailored for specific AFM-in-SEM applications.

AFM-in-SEM approach gives an access to measurements and applications that were not possible with separate AFM and SEM systems. All the way from heated/cooled stage for e.g. life-science applications to micro tensile tester for e.g. characterization of metals – let us know about your requirements to be able to take full advantage of the AFM-in-SEM concept.