Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.
Next step for correlative imaging
Correlative microscopy is an approach that benefits from the imaging of the same object by two different techniques.
Correlative Probe and Electron Microscopy (CPEM) has been developed for the application using Correlative Imaging (patented) and brings the solution, which synchronizes:
CPEM enables simultaneous detection and acquisition of AFM and SEM signals at the same time and in the same place.
Electron beam points close to the AFM tip with a constant offset. During scanning, the AFM tip and electron beam remain static – the sample is being scanned solely by the piezo scanner.
In our NenoView software, SEM and AFM channels can be selected, viewed, and recorded at the same time.