LiteScope™

Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.

AFM in SEM LiteScope

LiteScope™: LiteScope package

LiteScope package consists of:

LiteScope – scan head
NenoBox – control unit
NenoView – control software
SEM adaptor
Vacuum feedthrough
Cabling

LiteScope - scan head

LiteScope is an AFM microscope designed for fast and easy integration within SEM instruments (operational as a standalone AFM as well).

Supports Correlative Probe and Electron Microscopy technology (CPEM)
Comprehensive surface characterization – topography, roughness, material electrical and mechanical properties
Compact design compatible with most SEM systems
Easy SEM mounting/removal in under five minutes
Compatible with FIB, GIS, EDX, and other accessories
Self-sensing probes without optical detection or laser adjustment
Highly customizable
- Optional scanner configurations
- Optional macro approach configuration
- Versions for field-free or magnetic immersion SEMs available
- Special accessories and modules

Nenobox - control unit

All electronics running LiteScope are integrated into one control unit, which replaces the need for an additional dedicated computer. This unit is a standard 19” rack and may easily be mounted on the free slot of SEM electronics or simply positioned free to match the needs of the task at hand.

Maximum PLL (phase-locked loop) frequency for dynamic measurements 75 kHz suitable for tuning fork-based probes (or higher using external PLL or to customer requirement)
2×16-bit DAC per scan-axis to reach maximal resolution everywhere within the view field
5×16 bit auxiliary inputs for simultaneous measurements of user signals (±10 V)
Input signals may be employed in a four-channel feedback-loop mixer
External probe excitation
Ethernet connection
The preamplifier is situated within the body of the LiteScope™, ensuring a significant reduction of electrical interference

NenoView - control software

NenoView is a user-friendly, web-based software, which allows us to fully control the set-up measurements, data acquisition, and data processing. NenoView supports CPEM technology and enables it to utilize correlative imaging directly and internally.

Web-based user interface
- Remote access to user data
- Remote experiment control via tablet, smartphone, etc.
Easy for new users, flexible for experts
Saves the data with all the information including measurement setup
User accounts individually configurable
A download of data from control PC to local computer
Integrated data postprocessing, analyses, export ,etc.

In NenoView software, SEM and AFM channels can be selected, viewed, and recorded at the same time.

Subscribe to our newsletter

Stay up to date and receive the latest news