Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.
LiteScope is an AFM microscope designed for fast and easy integration within SEM instruments (operational as a standalone AFM as well).
All electronics running LiteScope™ is integrated into one control unit, which replaces the need for an additional dedicated computer. This unit is a standard 19” rack and may easily be mounted on the free slot of SEM electronics or simply positioned free to match the needs of the task in hand.
NenoView is user-friendly, web-based software, which allows to fully control the set-up measurements, data acquisition and data processing. NenoView supports CPEM technology and enables it to utilize correlative imaging directly and internally.