There is another brand new application note ready for you! Its name is Characterization of 2D nanomaterials using AFM-in-SEM LiteScope™.
2D nanomaterials are very promising for many applications, including flexible electronics, nanodevices, precise sensors, protective coating, solar cells, drug delivery, DNA sequencing, and many others. Even though they have many advantages, their production faces some challenges. For example, it is difficult to grow large and defect-free films of nanomaterials. The analysis of such structures can be challenging due to the size, thickness, and poor SEM contrast of the thin layers. LiteScope represents the best possible solution on how to deal with all these issues.
Download the full document here: https://www.nenovision.com/downloads/application-notes/?_fid=hy21