During international Applied Mechanics conference on April 25-27, 2017 you can listen to NenoVision CEO, Jan Neuman, delivering a lecture about the LiteScope and the unique CPEM technology. Use the opportunity to get more information about Correlative microscopy, an approach that benefits from the imaging of the same object by two different techniques.
CPEM technology is the first of its kind on the market to allow measurement of AFM and SEM in the same place and at the same time using the same coordination system.
Scanning sample by means of electrons for 2D analysis.
Scanning sample by means of a physical probe.
Combines both techniques and provides unique correlative imaging.