LiteScope will be introduced at Near-field methods workshop in Lednice

2017-02-18

If you would like to become more familiar with the LiteScope and possible application for your projects do not miss the next bi-annual SPM workshop that will take place between 29th and 31st March 2017 in Lednice, Czech Republic.

NenoVision is a proud sponsor of this workshop and its representatives will introduce there the LiteScope using the unique Correlative Probe and Electron Microscopy (CPEM) technology as the first solution on the market which enables to measure the SPM and SEM on the same place, same time using the same coordination system. 

Reach us and explore personally the unique advantages of integration SPM and SEM techniques.

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SEM technology

SEM technology

Scanning sample by means of electrons for 2D analysis.

AFM technology

AFM technology

Scanning sample by means of a physical probe.

CPEM technology

CPEM technology

Combines both techniques and provides unique correlative imaging.