NenoVision holds a workshop on LiteScope SPM/SEM integration

2017-06-21

Nenovison will present new measurement techniques for the true correlative imaging which enable direct comparison of the images from SEM and SPM. In the second half participants will have a chance to see LiteScope directly operated in the CEITEC Nano facilities. New possibilities of the correlative microscopy by CPEM will be introduced on June 27, 2017 in CEITEC BUT at 10:00. For more information see CEITEC.