NenoVision Webinar Series on Correlative AFM in SEM

2020-06-05

We would like to invite you to our webinar series where the key elements of our technology will be demonstrated and explained. Don't forget to register!

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You will have a chance to:

✓  Explore the key features of LiteScope™, its application areas, and measurement modes.
✓   Gain a comprehensive overview of the advantages that LiteScope brings to correlative AFM in SEM measurements.
✓   Discuss your application and meet our experts online.

Snímek obrazovky 2020-06-03 v 14.55.00

Webinars start from 18/6/2020 in weekly intervals. Save the dates!

1. LiteScope overview - merge the forces of AFM and SEM (approx 90 min) 

18/6/2020 10:00 CEST (with J. Očadlík, J. Horák, and V. Hegrová)

 

2. Online coffee breaks with NenoVision (approx 20 min each)

  • 25/6/2020 10:00 CEST- CPEM technology – next step in correlative imaging (with J. Horák and V. Hegrová)
  • 2/7/2020   10:00 CEST- Applications for 2D materials (with J. Horák and V. Hegrová)
  • 9/7/2020   10:00 CEST- Advantages of combining AFM with FIB-SEM systems (with J. Horák and V. Hegrová)
  • 16/7/2020 10:00 CEST- Measurement tutorial with LiteScope (with J. Horák and V. Hegrová)

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