New video! Performance of unique CPEM™ technique

2019-03-25

We brought the analysis and characterisation of graphene and 2D materials to the next level...

CPEM video - screenshot

Check out our new video presenting the analysis of 2Dmaterials using our AFM LiteScope in SEM

LiteScope is equipped with unique technology called CPEM™ (Correlative Probe and Electron Microscopy) enabling simultaneous measurement of multiple signals!

Do you want to try with your samples? It's all free!

For more information don't hesitate to contact our application department at application@nenovision.com