Key benefits in the characterisation of Powders, Particles, and 2D materials by AFM-in-SEM

Key benefits in the characterisation of Powders, Particles, and 2D materials by AFM-in-SEM

What you will learn:

  • How to effectively measure and determine the surface roughness of powders and particles.
  • About the importance of multimodal study of low-dimensional materials for understanding the advanced properties of new functional 2D materials.
  • Veronika has also introduced some practical examples from the pharmaceutical and ceramic industries.

Surface roughness in pharmaceutical industry

In the pharmaceutical industry, measuring surface roughness can be helpful in targeted drug delivery. In the webinar, Veronika describes how the surface roughness of carrier particles with and without the active pharmaceutical ingredient (API) can differ according to where and how the API is bound. Such insights enable the evaluation of how effective the carriers can be and contribute to further development of targeted drug delivery technology.

If You would like to see the whole webinar, use the button below. You will be redirected to your email client, where you only need to fill out the message, for instance:

Hi NenoTeam, I would like to see the whole webinar, please! + Your name. 

After receiving Your email, we will get back to you as soon as possible!

Send us a quick email request to get the full webinar!

We have recently acquired the NenoVision AFM. This AFM is running inside the chamber of one of our SEMs and it enables us to do a correlative study of all materials. We can combine whatever we see in the SEM with whatever the AFM delivers. There are so many things you can do with such an AFM. It's like having a Swiss army knife inside the chamber of your SEM.

Marc-Georg Willinger
TU Munich / Professor

We have greatly appreciated every aspect of our collaboration with NenoVision. Our communication has been smooth, efficient, and informative. By utilizing their novel CPEM technology, NenoVision helped us gain unique 3D information about our nano-sized samples deposited on cm-sized substrates. The unique ability to utilize both SEM and AFM at the same time allowed us to directly correlate the size and mechanical properties of silk nanowires. We truly appreciated all the assistance we received from NenoVision and hope to continue this fruitful collaboration in the future.

Wouter Metsola van der Wijngaart
Department of Micro and Nanosystems, KTH Royal Institute of Technology / Deputy head of Department

LiteScope is a true extension of horizons in the field of material engineering and semiconductors. I appreciate the innovative approach of its creators who were not afraid to look at AFM technology from a different perspective. I am honored that our institute has a serial number 01.

Antonín Fejfar
Institute of Physics of the Czech Academy of Sciences / Deputy director