NenoVision Support Center allows you to explore the materials that explain the benefits of LiteScope™ and Correlative Probe and Electron Microscopy.


NenoVision Webinar Series: Applications for 2D materials

2D nanomaterials are very promising for many applications but their production faces some challenges and the analysis of such structures can be challenging due to the size, thickness, and poor SEM contrast of the thin layers. Watch our webinar and see how LiteScope helps to overcome these difficulties.

NenoVision Webinar Series: CPEM technology – next step in correlative imaging

What is the next level of correlative imaging? Correlative Probe and Electron Microscopy (CPEM) enables you to simultaneously acquire various AFM and SEM signals covering surface topography, mechanical properties, SE, BSE, and other SEM images. All images are directly correlated with exceptional precision. Watch this webinar record and explore how CPEM technology works.

NenoVision Webinar Series: LiteScope overview - Merge the forces of AFM and SEM

The need to analyze and characterize objects from micro to nanoscale is fastly growing. SEM and AFM techniques are the most common with an extensive user pool. Therefore we have developed LiteScope™ which is a unique atomic force microscope (AFM) designed for fast and easy integration into scanning electron microscopes (SEMs). In-situ AFM-in-SEM measurement opens new possibilities and enables to combine advantages of both techniques. In this webinar, you will learn the main features of LiteScope and see for yourself how easy it is to be operated.

Analysis of 2D materials by AFM-in-SEM LiteScope

Did you know that there is a large number of applications for which 2D nanomaterials are very promising? The analysis of such structures can be challenging due to the size, thickness, and poor SEM contrast of the thin layers. Our AFM-in-SEM LiteScope represents the best possible solution on how to deal with all these issues.

LiteScope integration into SEM microscope

LiteScope is an AFM microscope designed for fast and easy (plug-and-play) integration within SEM instruments. It allows you to get precise in-time image correlation without limiting the imaging options of either system. On top of that, it enables user-friendly operation and easy remote access.

Load-lock mechanism for AFM-in-SEM LiteScope

Check the new accessory we have developed to improve measurement workflow and user experience with our microscope. Load-lock mechanism provides the possibility of loading samples and probes into LiteScope using a standard SEM Air-lock/Load-lock sample transfer system.

NenoVision: the first Spin-off company of CEITEC Brno University of Technology

In NenoVision, we convert science into commercial products. Because we think science has the power to make our world a safer, more efficient, and more sustainable place to live.
Thanks to CEITEC, we have a strong partner on our path to the global market.

Meet NenoVision company

Meet NenoVision and its unique miscroscope LiteScope™ which was developed for integration into the scanning electron microscopes. The company was awarded Seal of Excellence that confirms the quality on the European market.