NenoVision Support Center allows you to explore the materials that explain the benefits of LiteScope™ and Correlative Probe and Electron Microscopy.
✓ Explore the key features of LiteScope™, its application areas, and measurement modes.
✓ Gain a comprehensive overview of the advantages that LiteScope brings to correlative AFM in SEM measurements.
✓ Discuss your application with our experts online.
1. LiteScope overview - merge the forces of AFM and SEM (approx. 90 min)
18/6/2020 10:00 CEST (with J. Očadlík, J. Horák, and V. Hegrová)
The need to analyze and characterize objects from micro to nanoscale is fastly growing. SEM and AFM techniques are the most common with an extensive user pool. Therefore we have developed LiteScope™ which is a unique atomic force microscope (AFM) designed for fast and easy integration into scanning electron microscopes (SEMs). In-situ AFM-in-SEM measurement opens new possibilities and enables to combine advantages of both techniques. In this webinar, you will learn the main features of LiteScope and see for yourself how easy it is to be operated.
2. Online coffee breaks with NenoVision (approx. 20 min each)
These four shorter webinars aim to provide detailed information on specific topics.