NenoVision Support Center is a place where you find all the materials that explain the benefits of LiteScope and correlative microscopy.
In cooperation with our dear partners from Digital Surf we are prepared a free online workshop, which took place on the 30th of March. In the first part, CEO of NenoVision Jan Neuman speaks about complex data acquisition by unique AFM for SEM LiteScope™, the second part given by Arnaud Viot is focused on processing of acquired data sets using MountainsSPIP® software.
At the occasion of the release of LiteScope 2.0, we organized a webinar dedicated to its principal and unique feature, correlative AFM in SEM microscopy. During the webinar guided you our CEO Jan Neuman, who presented the second generation of our LiteScope, its unique applications and also crucial benefits and advantages of the innovative technology which represents.
✓ Watch the video records of our webinars and explore the key features of LiteScope, its application areas, and measurement modes.
✓ You will gain a comprehensive overview of the advantages that LiteScope brings to correlative AFM in SEM measurements.
Would you like to find out how easy it is to operate with our LiteScope? See for yourself how the measuring workflow looks like all the way from integration into the SEM chamber to AFM and SEM data correlation in NenoView software.
Merging LiteScope with FIB-SEM systems allows not only for evaluation and control of the FIB nanofabrication process but also enables its optimization. Researchers gain enhanced possibilities of surface characterization and control over FIB milling processes. See how to modify the sample surface and measure it immediately by AFM in in-situ conditions.
2D nanomaterials are very promising for many applications but their production faces some challenges and the analysis of such structures can be challenging due to the size, thickness, and poor SEM contrast of the thin layers. Watch our webinar and see how LiteScope helps to overcome these difficulties.
What is the next level of correlative imaging? Correlative Probe and Electron Microscopy (CPEM) enables you to simultaneously acquire various AFM and SEM signals covering surface topography, mechanical properties, SE, BSE, and other SEM images. All images are directly correlated with exceptional precision. Watch this webinar record and explore how CPEM technology works.
The need to analyze and characterize objects from micro to nanoscale is fastly growing. SEM and AFM techniques are the most common with an extensive user pool. Therefore we have developed LiteScope™ which is a unique atomic force microscope (AFM) designed for fast and easy integration into scanning electron microscopes (SEMs). In-situ AFM-in-SEM measurement opens new possibilities and enables to combine advantages of both techniques. In this webinar, you will learn the main features of LiteScope and see for yourself how easy it is to be operated.