NenoVision Support Center allows you to explore the materials that explain the benefits of LiteScope™ and Correlative Probe and Electron Microscopy.


Join NenoVision Webinar Series on Correlative AFM in SEM

✓   Explore the key features of LiteScope™, its application areas, and measurement modes.
✓   Gain a comprehensive overview of the advantages that LiteScope brings to correlative AFM in SEM measurements.
✓   Discuss your application with our experts online.


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Snímek obrazovky 2020-06-03 v 14.55.00


1. LiteScope overview - merge the forces of AFM and SEM (approx. 90 min)
18/6/2020 10:00 CEST (with J. Očadlík, J. Horák, and V. Hegrová)

The need to analyze and characterize objects from micro to nanoscale is fastly growing. SEM and AFM techniques are the most common with an extensive user pool. Therefore we have developed LiteScope™ which is a unique atomic force microscope (AFM) designed for fast and easy integration into scanning electron microscopes (SEMs). In-situ AFM-in-SEM measurement opens new possibilities and enables to combine advantages of both techniques. In this webinar, you will learn the main features of LiteScope and see for yourself how easy it is to be operated.

2. Online coffee breaks with NenoVision (approx. 20 min each)

These four shorter webinars aim to provide detailed information on specific topics.

  • 25/6/2020 10:00 CEST- CPEM technology - next step in correlative imaging (with J. Horák and V. Hegrová)
    • ​LiteScope is equipped with a patented measurement technique for correlative measurements called CPEM™ (Correlative Probe and Electron Microscopy). CPEM enables you to simultaneously acquire various AFM and SEM signals covering surface topography, mechanical properties, SE, BSE, and other SEM images. All images are directly correlated with exceptional precision. Watch this webinar and explore how CPEM technology works.


  • 2/7/2020   10:00 CEST- Applications for 2D materials (with J. Horák and V. Hegrová)
    • 2D nanomaterials are very promising for many applications, including flexible electronics, nanodevices, precise sensors, protective coating, solar cells, drug delivery, DNA sequencing, and many others. Even though they have many advantages, their production faces some challenges and the analysis of such structures can be challenging due to the size, thickness, and poor SEM contrast of the thin layers. See how LiteScope helps to overcome these difficulties.


  • 9/7/2020   10:00 CEST- Advantages of combining AFM with FIB-SEM systems (with J. Horák and V. Hegrová)
    • ​FIB-SEM system combines SEM imaging with the possibility of precise surface modification. Merging LiteScope with FIB-SEM systems allows not only for evaluation and control of the FIB nanofabrication process but also enables its optimization. As a researcher, you gain enhanced possibilities of surface characterization and control over FIB milling processes. See how you can modify the sample surface and measure it immediately by AFM in in-situ conditions.


  • 16/7/2020 10:00 CEST- Measurement tutorial with LiteScope (with J. Horák and V. Hegrová)
    • In this step-by-step tutorial, you will become familiar with the NenoView software. We will use an AFM topographical measurement that will clearly demonstrate all the commonly used features of the NenoView software, from the very begging all the way to AFM and SEM data correlation.


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