NenoVision Support Center is a place where you find all the materials that explain the benefits of LiteScope and correlative microscopy.


Webinar Series on Correlative AFM in SEM

✓   Watch the video records of our webinars and explore the key features of LiteScope, its application areas, and measurement modes.
✓   You will gain a comprehensive overview of the advantages that LiteScope brings to correlative AFM in SEM measurements.

NenoVision Webinar Series: Measuring tutorial with LiteScope

Would you like to find out how easy it is to operate with our LiteScope? See for yourself how the measuring workflow looks like all the way from integration into the SEM chamber to AFM and SEM data correlation in NenoView software.

NenoVision Webinar Series: Advantages of combining AFM with FIB-SEM systems

Merging LiteScope with FIB-SEM systems allows not only for evaluation and control of the FIB nanofabrication process but also enables its optimization. Researchers gain enhanced possibilities of surface characterization and control over FIB milling processes. See how to modify the sample surface and measure it immediately by AFM in in-situ conditions.

NenoVision Webinar Series: Applications for 2D materials

2D nanomaterials are very promising for many applications but their production faces some challenges and the analysis of such structures can be challenging due to the size, thickness, and poor SEM contrast of the thin layers. Watch our webinar and see how LiteScope helps to overcome these difficulties.

NenoVision Webinar Series: CPEM technology – next step in correlative imaging

What is the next level of correlative imaging? Correlative Probe and Electron Microscopy (CPEM) enables you to simultaneously acquire various AFM and SEM signals covering surface topography, mechanical properties, SE, BSE, and other SEM images. All images are directly correlated with exceptional precision. Watch this webinar record and explore how CPEM technology works.

NenoVision Webinar Series: LiteScope overview - Merge the forces of AFM and SEM

The need to analyze and characterize objects from micro to nanoscale is fastly growing. SEM and AFM techniques are the most common with an extensive user pool. Therefore we have developed LiteScope™ which is a unique atomic force microscope (AFM) designed for fast and easy integration into scanning electron microscopes (SEMs). In-situ AFM-in-SEM measurement opens new possibilities and enables to combine advantages of both techniques. In this webinar, you will learn the main features of LiteScope and see for yourself how easy it is to be operated.