Applications

Explore the next level of correlative microscopy

Choose your application field

Characteristics of materials such as their structural, mechanical, chemical, electrical, and magnetic properties Material science

In-situ analysis of special applications such as surface modification, failure analysis, and surface chemical analysis Nanostructures

AFM-in-SEM approach in semiconductor manufacturing, failure analysis, research, and development. Semiconductors

Measurements on biological samples at the nanoscale that are difficult or even impossible using separate imaging modalities Life science

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Czech Republic
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+420 605 287 732

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