Projects realized by NenoVision

Project No. CZ.02.01.01/00/23_020/0008549

This project is co-financed by the European Union.

The aim of the project is to focus on applied research with partners from the application sector in strategic areas for the Czech Republic, such as transport and energy. The research will lead to new materials that enhance the functionality, longevity, and safety of critical equipment components, such as fuel rods, high-temperature devices, and turbine blades. The project is strengthened by the long-term partnership between the applicant and application sector partners.

Project No.: FW10010168

This project is co-financed with state support from the Technology Agency of the Czech Republic within the TREND Program. This project was funded as part of the National Recovery Plan from the European Recovery and Resilience Facility.

The main goal is to develop and commercialize a new generation of AFM accessories for electron microscopes, thereby significantly increasing their use for comprehensive in-situ characterization of new materials, energy storage technologies, and in the semiconductor industry.

This project is financed by European Union.

Project No.: TN02000020

This project is co-financed with state support from the Technology Agency of the Czech Republic within the NCK Program.

This project is funded under the National Recovery Plan from the European Instrument for Reconstruction and Resilience.

The Centre unifies all the key academic and industrial players in Czechia dealing with R&D and technology transfer in electron microscopy and lithography, optical microscopy and spectroscopy, laser and fiber technologies, optical and quantum metrology, ultraprecise optical manufacturing and sophisticated optical systems. Such a complementary synergy upgrades decades of partners’ experience and bilateral fruitful collaboration to a level where associated Czech research and industry approach worldwide leaders, create new positions and significantly increase added value of industrial production.

Principal Investigator: prof. Ing. Josef Lazar, Dr.

NenoVision Investigator: Jan Neuman

Co-investigators: Lazar Josef - Ústav přístrojové techniky AV ČR, v.v.i., Kůr Jan - MESING, spol. s r.o., Úlehla Libor - Meopta - optika, s.r.o., Škereň Marek - IQS Group s.r.o., Smrž Martin - Fyzikální ústav AV ČR, v. v. i., Nejezchleb Karel - CRYTUR, spol. s r.o., Šprdlík Vít - Compo Tech PLUS, spol. s r. o., Nebesářová Jana - Biologické centrum AV ČR, v.v.i., Urban František - NETWORK GROUP, s.r.o., Trtílek Martin - PSI (Photon Systems Instruments), spol. s r.o., Plešinger Jaroslav - TechSoft Engineering, spol. s r.o., Vystavěl Tomáš - Thermo Fisher Scientific Brno s.r.o., Honzátko Pavel - Ústav fotoniky a elektroniky AV ČR, v. v. i., Lédl Vít - Ústav fyziky plazmatu AV ČR, v. v. i., Šlouf Miroslav - Ústav makromolekulární chemie AV ČR, v. v. i., Hozák Pavel - Ústav molekulární genetiky AV ČR, v. v. i., Hošek Jan - České vysoké učení technické v Praze / Fakulta strojní, Nováček Jiří - Masarykova univerzita, Řeháček Jaroslav - Univerzita Palackého v Olomouci, Kolíbal Miroslav - Vysoké učení technické v Brně, Sředoevropský technologický institut

Date from: 01. 01. 2023

Date to: 31. 12. 2028

Project No.: TM 03000033

The project is co-financed with the support of Technology agency of the Czech Republic within the framework of the Program DELTA2.

The aims of the project were set as follows:

• To innovate and commercialize new methods and state-of-the-art instrumentation in correlative probe-electron (AFM-SEM) microscopy.
• To develop (HW, SW, methods), demonstrate, and promote the use of the correlative AFM and SEM microscopy for key topical applications in photovoltaics, photocatalysis, nanolithography, nanodevices, biosensors, and life sciences.
• To develop the worldwide first Tabletop AirSEM integrated with AFM and demonstrate its use for state-of-art correlative AFM-SEM microscopy under ambient conditions.

NenoVision company closely cooperates with several academic partners within this project: Czech University of Technology in Prague, Faculty of Electrical Engineering; Jeonbuk National University; Korea Institute of Science and Technology

Project No.: FW 03010504

The project is co-financed with the support of Technology agency of the Czech Republic within the framework of the Program TREND.

The aim of the project is to develop new technologies for the LiteScope device expanding its imaging capabilities with functionalities that will attract new users-customers and help Nenovision to establish itself in developed foreign markets. Three areas have been identified that will allow the necessary technological and commercial advantage to be obtained. The project covered development of:

• unique multifunctional probes for scanning probe microscopy with the possibility of applying electrical voltage, intense laser light and a working gas through a probe cavity to the sample surface,
• highly compact device for in-situ mechanical loading,
• very own precision probes and automated etching equipment for their electrochemical preparation and their characterization.

NenoVision company closely cooperates with several academic partners within this project: Brno University of Technology – Institute of Physical Engineering, Institute of Physics of Materials of Czech Academy of Sciences and Institute of Scientific Instruments of Czech Academy of Sciences.

Project No. FW1010183

This project is co-financed with the support of Technology agency of the Czech Republic within the Program TREND framework.

The aim is to strengthen competitiveness and commercial potential of NenoVision's LiteScope on the international market with the help of next generation equipment and accessories. These innovations will focus on 4 areas that represent the project's sub-goals:

• Upgrade of hardware devices - development of new HW modules that allow sample rotation, cooling, heating and probe loading through Load-Lock of electron microscopes.
• Software development of image analysis procedures which are obtained by multilevel correlation techniques.
• Development of applications and examples of correlative techniques combining AFM/SEM with the use of newly developed hardware and software modules.
• Cooperation between NenoVision and academic partners with transfer of experience, know-how and technology.

Project No. FV 40238

POMITE project is implemented with the financial support from the state budget via the Ministry of Industry and Trade of the Czech Republic via the TRIO program.

The aim of the POMITE project is to develop new applications for AFM microscope LiteScope that will allow it´s wider commercial use. Within the POMITE project three areas for innovations of the LiteScope product are identified:

• Fast imaging – acceleration of the measuring time thanks to up-grade of selected components.
• Nanoindentation – innovation of the LiteScope with techniques that enable the users to characterize mechanical features of their samples.
• Development of software and other instruments that help with interpretation of data for correlative imaging and advanced microscopy techniques.

Project Registration Number: CZ.01.02.01/04/23_017/0002830

The project is funded by the European Union.

The aim of the project is the active presentation of the company at five international trade fairs, increasing the company's competitiveness in new foreign markets, and establishing a stable business position and good reputation for the company in these markets.

Project No. CZ.01.02.01/04/24_044/0005727

The project is co-funded by the European Union.

The aim of the project is the active presentation of the company at three international trade fairs, increasing the company's competitiveness in new foreign markets, and establishing a stable business position and good reputation for the company in these markets.

Project number: CZ.01.1.02/0.0/0.0/20_358/0027762

The project is funded by the European Union.

This project focuses on collaboration with the Institute of Physics of Materials of the Czech Academy of Sciences. Specifically, it addresses the development and optimization of a two-pass measurement methodology for electron-beam-induced current (EBIC), which eliminates the parasitic component of the apparent EBIC signal caused by secondary electrons, and the implementation of this methodology for the LiteScope AFM-in-SEM. The project strengthens our own innovation activities.