Complex and correlative sample analysis
Unique CPEM technology enables complex sample characterisation via in-time correlation of different AFM and SEM channels.
In-situ sample characterization
In-situ conditions inside the SEM ensure sample analysis at the same time, in the same place and under the same conditions.
Precise localization of the region of interest
Extremely precise and timesaving approach uses SEM to navigate the AFM tip to the region of interest, enabling its fast & easy localization.
Unique technology for correlative imaging
The Correlative Probe & Electron Microscopy (CPEM) is a cutting-edge technology developed specially for seamless integration of AFM and SEM.
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Publication
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10. 01. 2023
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by Stanislav Luska
PVDF samples analysed by LiteScope in a new research article
Material Science
Product
Other
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04. 01. 2023
Merrow Scientific is our new distributor for the UK
Product
Publication
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22. 12. 2022
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by Stanislav Luska
LiteScope brings results in liquid droplets research
Nanostructures
Product
Technology
Event
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01. 12. 2022
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by Stanislav Luska
NenoVision heading to MRS Fall in Boston
Material Science
Product
Technology