LiteScope™
Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes.
✓ Explore the capabilities of true correlative microscopy.
✓ Merge the forces of SEM and AFM.
Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes.
✓ Explore the capabilities of true correlative microscopy.
✓ Merge the forces of SEM and AFM.
The CPEM technology is the first solution on the market which enables you to simultaneously measure the AFM and SEM signals in the same place, at the same time while using the same coordination system.
LiteScope offers easy and swift replacement of probes and samples. A significant advantage is also simple SEM mounting/dismounting in less than five minutes.
LiteScope incorporates a wide range of SPM imaging modes, such as STM, cAFM, ncAFM, EFM, MFM, KPFM, and others which can be easily used by means of replaceable probes.
Characteristics of materials such as their structural, mechanical, chemical, electrical, and magnetic properties
In-situ analysis of applications such as surface modification, failure analysis, and surface chemical analysis