LiteScope™
LiteScope™ is an Atomic Force Microscope designed for easy integration into variety of Scanning Electron Microscopes, enabling in-situ correlative sample characterization in the nanoscale.
AFM-in-SEM key values
Complex and correlative sample analysis
Unique technology of multidimensional correlative imaging enables simultaneous acquisition of data from SEM and AFM, and their seamless correlation into 3D images.
In-situ conditions
All measurements are done at the same time, in the same place and under the same conditions, preventing the need of sample transfer and risk of contamination during analyses.
Precise localization of the region of interest
Extremly precise and time saving approach using SEM to localize and navigate the AFM to the region of interest.
Main application fields
Material science
Characteristics of materials such as their structural, mechanical, chemical, electrical, and magnetic properties
Nanostructures
In-situ analysis of applications such as surface modification, failure analysis, and surface chemical analysis
We have greatly appreciated every aspect of our collaboration with NenoVision. The unique ability to utilize both SEM and AFM at the same time allowed to directly correlate the size and mechanical properties of silk nanowires.
Prof. Wouter Metsola van der WijngaartDeputy head of Department of Micro and Nanosystems, KTH Royal Institute of Technology, Sweden
We implement the AFM in SEM technology in the field of low dimensional materials research. The correlative AFM in SEM microscopy embodied in LiteScope opens up a brand new dimension of knowledge about these materials' properties and their optimization.
prof. RNDr. Michal Otyepka, Ph.D.Vice-Director of the Regional Centre of Advanced Technologies and Materials, Olomouc
The extraordinary level of expertise and scientific knowledge that I found in NenoVision is fundamental for my project and the high quality of the imaging obtained with LiteScope has produced outstanding results so far. I hope to keep continuing my collaboration with NenoVision also in the future.
Marco Cassani, Ph.D.Researcher at the Cardiovascular System Mechanobiology Group, St. Ann's University Hospital Brno
LiteScope is a true extension of horizons in the field of material engineering and semiconductors. I appreciate the innovative approach of its creators who were not afraid to look at AFM technology from a different perspective. I am honored that our institute has a serial number 01.
RNDr. Antonín Fejfar, CSc.Deputy director of the Institute of Physics, Czech Academy of Sciences
The unique idea of students has been transformed into a world patent LiteScope that has the chance to disturb the waters of nanoscience. It is pleasing to use the knowledge gained through this invention in international projects.
