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Benefits of AFM-in-SEM solution
Combining the strengths of Atomic force microscope and Scanning electron microscope opens a wide range of possibilities. Thanks to seamless integration and one click operations is possible to correlate various measurements in real time.
See the unique benefits of the AFM-in-SEM solution, which assure you measurement results impossible to reach by separate AFM and SEM techniques. Check the biggest advantages of in-situ analysis by using them simultaneously!
Cutting-edge CPEM technology allows the simultaneous acquisition of AFM and SEM data and their seamless correlation.
In-situ conditions inside the SEM ensure sample analysis at the same time, in the same place and under the same conditions.
Extremely precise and timesaving approach uses SEM to navigate the AFM tip to the region of interest, enabling its fast & easy localization.
AFM-in-SEM offers a broad field of sample analysis. Simultaneous utilization of Scanning electron microscope and Atomic force microscope is indispensable for advanced 3D correlative analysis while reducing overal image acquisition time.
The easy & efficient workflow assures fast and quality measurement results. With the ultra-high resolution and unparalleled accuracy of image alignment, the versatility of LiteScope brings the new possibilities into variety of application areas:
We develop and produce AFM-in-SEM LiteScope, used for correlative in-situ analysis of microscopic samples. Learn about our unique AFM-in-SEM solution, its capabilites & modalities:
Unique technology for correlative imaging
The Correlative Probe & Electron Microscopy (CPEM) is a cutting-edge technology developed specially for seamless integration of AFM and SEM.