LiteScope™
LiteScope™ is an Atomic Force Microscope designed for easy integration into variety of Scanning Electron Microscopes, enabling in-situ correlative sample characterization in the nanoscale.
LiteScope™ is an Atomic Force Microscope designed for easy integration into variety of Scanning Electron Microscopes, enabling in-situ correlative sample characterization in the nanoscale.
Unique technology of multidimensional correlative imaging enables simultaneous acquisition of data from SEM and AFM, and their seamless correlation into 3D images.
All measurements are done at the same time, in the same place and under the same conditions, preventing the need of sample transfer and risk of contamination during analyses.
Extremly precise and time saving approach using SEM to localize and navigate the AFM to the region of interest.
Characteristics of materials such as their structural, mechanical, chemical, electrical, and magnetic properties
In-situ analysis of applications such as surface modification, failure analysis, and surface chemical analysis