

Benefits of AFM-in-SEM solution
Combining the strengths of Atomic force microscope and Scanning electron microscope opens a wide range of possibilities. Thanks to seamless integration and one click operations is possible to correlate various measurements in real time.

Unique CPEM technology enables complex sample characterisation via in-time correlation of different AFM and SEM channels.

In-situ conditions inside the SEM ensure sample analysis at the same time, in the same place and under the same conditions.

Extremely precise and timesaving approach uses SEM to navigate the AFM tip to the region of interest, enabling its fast & easy localization.
Applications
AFM-in-SEM offers a broad field of sample analysis. Simultaneous utilization of Scanning electron microscope and Atomic force microscope is indispensable for advanced 3D correlative analysis while reducing overal acquisition time. With unparalleled accuracy of image alignment, the versatility of LiteScope brings the new possibilities into variety of application areas:
Products
We develop and produce AFM-in-SEM LiteScope, used for correlative in-situ analysis of microscopic samples. Learn about our unique AFM-in-SEM solution, its capabilites & modalities:

Unique technology for correlative imaging
The Correlative Probe & Electron Microscopy (CPEM) is a cutting-edge technology developed specially for seamless integration of AFM and SEM.
Do you want to learn more? Feel free to...
Latest News

PVDF samples analysed by LiteScope in a new research article

Merrow Scientific is our new distributor for the UK

LiteScope brings results in liquid droplets research
