Nenovision

Semiconductor Failure Analysis

In-situ, site-specific, electrical and topographical characterization of semiconductor components at the nanoscale.

Learn more

LiteScope AFM-in-SEM

Merge the power of AFM and SEM in a single tool to explore the secrets of nanoworld.

Learn more

Battery Component Materials Analyses

Introducing our Battery Component Materials research solution.

Learn more

AFM LiteScope located in SEM visualisation

Next level of imaging

Learn more

LiteScope 2.5

This award-winning tool within the field of In-Situ Correlative Microscopy has the potential to revolutionize the way you perform correlative analysis.

In-situ multimodal & correlative analysis
Optimized & time-efficient workflow
Ultimate performance inside SEM
Open-hardware design for easy customization

The new generation of LiteScope AFM-in-SEM is built on the completely new state-of-the-art control unit NenoBox leveraging the performance and capabilities of the AFM-in-SEM to the new level.

Check our introduction video by our CEO Jan Neuman below. Do you want to know more details? Then click the contact us button!

Play video

Benefits of AFM-in-SEM solution

Combining the strengths of Atomic force microscope and Scanning electron microscope opens a wide range of possibilities. Thanks to seamless integration and one click operations is possible to correlate various measurements in real time.

See the unique benefits of the AFM-in-SEM solution, which assure you measurement results impossible to reach by separate AFM and SEM techniques. Check the biggest advantages of in-situ analysis by using them simultaneously!

Correlative multimodal sample analysis

Cutting-edge CPEM technology allows the simultaneous acquisition of AFM and SEM data and their seamless correlation.

Learn more

In-situ sample characterization

In-situ conditions inside the SEM ensure sample analysis at the same time, in the same place and under the same conditions.

Learn more

Precise localization of the region of interest

Extremely precise and timesaving approach uses SEM to navigate the AFM tip to the region of interest, enabling its fast & easy localization.

Learn more

Merge the forces of AFM and SEM

Applications

AFM-in-SEM offers a broad field of sample analysis. Simultaneous utilization of Scanning electron microscope and Atomic force microscope is indispensable for advanced 3D correlative analysis while reducing overal image acquisition time.

The easy & efficient workflow assures fast and quality measurement results. With the ultra-high resolution and unparalleled accuracy of image alignment, the versatility of LiteScope brings the new possibilities into variety of application areas:

Material science