Benefits of AFM-in-SEM solution
Combining the strengths of Atomic force microscope and Scanning electron microscope opens a wide range of possibilities. Thanks to seamless integration and one click operations is possible to correlate various measurements in real time.
Unique CPEM technology enables complex sample characterisation via in-time correlation of different AFM and SEM channels.
In-situ conditions inside the SEM ensure sample analysis at the same time, in the same place and under the same conditions.
Extremely precise and timesaving approach uses SEM to navigate the AFM tip to the region of interest, enabling its fast & easy localization.
Unique technology for correlative imaging
The Correlative Probe & Electron Microscopy (CPEM) is a cutting-edge technology developed specially for seamless integration of AFM and SEM.