NenoVision

LiteScope 2.0 was released. Learn more...

LiteScope in SEM2

AFM-in-SEM key values

Complex and correlative sample analysis

Unique technology of multidimensional correlative imaging enables simultaneous acquisition of data from SEM and AFM, and their seamless correlation into 3D images.

In-situ conditions

All measurements are done at the same time, in the same place and under the same conditions, preventing the need of sample transfer and risk of contamination during analyses.

Precise localization of the region of interest

Extremly precise and time saving approach using SEM to localize and navigate the AFM to the region of interest.

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Main application fields

Material science

Characteristics of materials such as their structural, mechanical, chemical, electrical, and magnetic properties

Nanostructures

In-situ analysis of applications such as surface modification, failure analysis, and surface chemical analysis

Semiconductors

AFM-in-SEM approach in semiconductor manufacturing, failure analysis, research, and development.

Life science

Measuring on biological samples at the nanoscale that are difficult or even impossible using separate imaging modalities.

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Prof. Wouter Metsola van der Wijngaart

We have greatly appreciated every aspect of our collaboration with NenoVision. The unique ability to utilize both SEM and AFM at the same time allowed to directly correlate the size and mechanical properties of silk nanowires.

Prof. Wouter Metsola van der WijngaartDeputy head of Department of Micro and Nanosystems, KTH Royal Institute of Technology, Sweden

prof. RNDr. Michal Otyepka, Ph.D.

We implement the AFM in SEM technology in the field of low dimensional materials research. The correlative AFM in SEM microscopy embodied in LiteScope opens up a brand new dimension of knowledge about these materials' properties and their optimization.

prof. RNDr. Michal Otyepka, Ph.D.Vice-Director of the Regional Centre of Advanced Technologies and Materials, Olomouc

Marco Cassani, Ph.D.

The extraordinary level of expertise and scientific knowledge that I found in NenoVision is fundamental for my project and the high quality of the imaging obtained with LiteScope has produced outstanding results so far. I hope to keep continuing my collaboration with NenoVision also in the future.

Marco Cassani, Ph.D.Researcher at the Cardiovascular System Mechanobiology Group, St. Ann's University Hospital Brno

RNDr. Antonín Fejfar, CSc.

LiteScope is a true extension of horizons in the field of material engineering and semiconductors. I appreciate the innovative approach of its creators who were not afraid to look at AFM technology from a different perspective. I am honored that our institute has a serial number 01.

RNDr. Antonín Fejfar, CSc.Deputy director of the Institute of Physics, Czech Academy of Sciences

prof. RNDr. Tomáš Šikola, CSc.

The unique idea of students has been transformed into a world patent LiteScope that has the chance to disturb the waters of nanoscience. It is pleasing to use the knowledge gained through this invention in international projects.

prof. RNDr. Tomáš Šikola, CSc.Research group Fabrication and Characterisation of Nanostructures coordinator, CEITEC BUT

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LiteScope™

LiteScope 2.0 was released. Learn more...

AFM-in-SEM key values

Complex and correlative sample analysis

In-situ conditions

Precise localization of the region of interest

Main application fields

Material science

Nanostructures

Semiconductors

Life science

Prof. Wouter Metsola van der WijngaartDeputy head of Department of Micro and Nanosystems, KTH Royal Institute of Technology, Sweden

prof. RNDr. Michal Otyepka, Ph.D.Vice-Director of the Regional Centre of Advanced Technologies and Materials, Olomouc

Marco Cassani, Ph.D.Researcher at the Cardiovascular System Mechanobiology Group, St. Ann's University Hospital Brno

RNDr. Antonín Fejfar, CSc.Deputy director of the Institute of Physics, Czech Academy of Sciences

prof. RNDr. Tomáš Šikola, CSc.Research group Fabrication and Characterisation of Nanostructures coordinator, CEITEC BUT

Nanoindentation module for LiteScope 2.0 available

Register for our online workshop on Correlative AFM in SEM image & data processing!

LiteScope 2.0 was released! Register to our webinar to learn more

LiteScope™

LiteScope 2.0 was released. Learn more...

AFM-in-SEM key values

Complex and correlative sample analysis

In-situ conditions

Precise localization of the region of interest

Main application fields

Material science

Nanostructures

Semiconductors

Life science

Prof. Wouter Metsola van der WijngaartDeputy head of Department of Micro and Nanosystems, KTH Royal Institute of Technology, Sweden

prof. RNDr. Michal Otyepka, Ph.D.Vice-Director of the Regional Centre of Advanced Technologies and Materials, Olomouc

Marco Cassani, Ph.D.Researcher at the Cardiovascular System Mechanobiology Group, St. Ann's University Hospital Brno

RNDr. Antonín Fejfar, CSc.Deputy director of the Institute of Physics, Czech Academy of Sciences

prof. RNDr. Tomáš Šikola, CSc.Research group Fabrication and Characterisation of Nanostructures coordinator, CEITEC BUT

Nanoindentation module for LiteScope 2.0 available

Register for our online workshop on Correlative AFM in SEM image & data processing!

LiteScope 2.0 was released! Register to our webinar to learn more

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