NenoVision
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Products
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Probes

Self-sensing probes for LiteScope

In LiteScope AFM-in-SEM can be used various self-sensing probes for measuring with different AFM techniques. The available probes extend the possibilities of multimodal imaging to a wide range of measurement techniques that assure in-situ analysis of various sample properties.

Akyiama probe

Akiyama

The go-to probe for CPEM measurements thanks to its visible tip. Capable of measuring AFM topography and energy dissipation signal at the same time.


Measurement modes: Topography, Energy dissipation

NenoProbe magnetic

NenoProbe Magnetic

Magnetic-sensitive probe based on the Akiyama sensor, that can be used in SEM thanks to its visible tip. It uses the same probe holder as regular Akiyama.


Measurement modes: Topography, MFM

NenoProbe Conductive

NenoProbe Conductive

Our self-produced AFM probe with a conductive tip, capable of performing C-AFM, KPFM, PFM and I-V spectroscopy.


Measurement modes: C-AFM, KPFM, PFM, I-V spectroscopy

PRSA

Piezo-resistive probes

AFM probe suitable for both dynamic and contact mode topography measurements and F-Z spectroscopy.


Measurement modes: Topography, F-z spectroscopy

See also

LiteScope AFM-in-SEM
LiteScope AFM-in-SEM
Measurement modes
LiteScope AFM-in-SEM Measurement modes
Applications
LiteScope AFM-in-SEM applications
CPEM
LiteScope AFM-in-SEM CPEM technology

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