Akiyama
The go-to probe for CPEM measurements thanks to its visible tip. Capable of measuring AFM topography and energy dissipation signal at the same time.
Measurement modes: Topography, Energy dissipation
NenoProbe Magnetic
Magnetic-sensitive probe based on the Akiyama sensor, that can be used in SEM thanks to its visible tip. It uses the same probe holder as regular Akiyama.
Measurement modes: Topography, MFM
NenoProbe Conductive
Our self-produced AFM probe with a conductive tip, capable of performing C-AFM, KPFM, PFM and I-V spectroscopy.
Measurement modes: C-AFM, KPFM, PFM, I-V spectroscopy
Piezo-resistive probes
AFM probe suitable for both dynamic and contact mode topography measurements and F-Z spectroscopy.
Measurement modes: Topography, F-z spectroscopy
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LiteScope Featured in a Breakthrough Study on Electron-Beam-Excited Conductive AFM
A new study has succesfully demonstrated Electron-Beam-Excited Conductive AFM (EBC-AFM) on semiconductive 2D materials – an approach that removes the need for back-contact and time consuming sample manipulation required with traditional conductive AFM. Instead, the SEM’s electron beam generates charge carriers that close the circuit with the AFM tip, making it possible to carry out fast, non-destructive electrical mapping of 2D materials, including full wafers.
ZrO2 Nanoparticles in Fe20Cr Oxide Dispersion-Strengthened Alloys Processed by Laser Powder Bed Fusion
The study investigates oxide nanoparticles (ONPs), specifically ZrO2 nanoparticles in Fe20Cr alloys, produced via laser powder bed fusion (PBF-LB/M), in order to understand how these nanoparticles impact the microstructure and mechanical properties. LiteScope was used for validating Electron Channeling Contrast Imaging (ECCI) findings and to distinguish nanoparticles (ONPs) from pores or preparation artifacts.
AFM-in-SEM LiteScope on the Cover of a Key Study on Diamond-Coated Probes
Researchers have developed a low-temperature plasma process to coat self-sensing AFM probes with boron-doped nanocrystalline diamond, boosting durability and sensitivity. This breakthrough enables precise electrical mapping of micro- and nanostructures in air and vacuum, advancing semiconductor technology.