Self-sensing probes for LiteScope
In LiteScope AFM-in-SEM can be used various self-sensing probes for measuring with different AFM techniques. The available probes extend the possibilities of multimodal imaging to a wide range of measurement techniques that assure in-situ analysis of various sample properties.

Akiyama
The go-to probe for CPEM measurements thanks to its visible tip. Capable of measuring AFM topography and energy dissipation signal at the same time.
Measurement modes: Topography, Energy dissipation

NenoProbe Magnetic
Magnetic-sensitive probe based on the Akiyama sensor, that can be used in SEM thanks to its visible tip. It uses the same probe holder as regular Akiyama.
Measurement modes: Topography, MFM

NenoProbe Conductive
Our self-produced AFM probe with a conductive tip, capable of performing C-AFM, KPFM, PFM and I-V spectroscopy.
Measurement modes: C-AFM, KPFM, PFM, I-V spectroscopy

Piezo-resistive probes
AFM probe suitable for both dynamic and contact mode topography measurements and F-Z spectroscopy.
Measurement modes: Topography, F-z spectroscopy
Are you interested? Feel free to...

FEBID-grown magnetic tips tested with LiteScope in a new article
This new article investigates the durability of FEBID-grown magnetic tips for MFM measurements.

AFM-in-SEM LiteScope 2.5: Redefining In-Situ Correlative Analyses

Fate of Gold Nanoparticles in Laser Desorption/Ionization Mass Spectrometry
This article explains how a new technique called LDI MSI can show where nanoparticles are located on a surface. And of course, it happened with help of the correlative AFM-in-SEM measurements!