Self-sensing probes for LiteScope
In LiteScope AFM-in-SEM can be used various self-sensing probes for measuring with different AFM techniques. The available probes extend the possibilities of multimodal imaging to a wide range of measurement techniques that assure in-situ analysis of various sample properties.
![Akyiama probe](https://webadmin.nenovision.com/media/images/products/probe_akyiama_zoom_16x9_new.png?width=900&height=0&rmode=min&quality=75&token=K1vKRncMWNI3T2006wdTIdy6fZYlV5VSfskugOtufUg%3D)
Akiyama
The go-to probe for CPEM measurements thanks to its visible tip. Capable of measuring AFM topography and energy dissipation signal at the same time.
Measurement modes: Topography, Energy dissipation
![NenoProbe magnetic](https://webadmin.nenovision.com/media/images/products/probe-akiyama_mfm_zoom_16x9-new.png?width=900&height=0&rmode=min&quality=75&token=K1vKRncMWNI3T2006wdTIdy6fZYlV5VSfskugOtufUg%3D)
NenoProbe Magnetic
Magnetic-sensitive probe based on the Akiyama sensor, that can be used in SEM thanks to its visible tip. It uses the same probe holder as regular Akiyama.
Measurement modes: Topography, MFM
![NenoProbe Conductive](https://webadmin.nenovision.com/media/images/products/probe_nenoprobe_conductive_adjusted_16x9.png?width=900&height=0&rmode=min&quality=75&token=K1vKRncMWNI3T2006wdTIdy6fZYlV5VSfskugOtufUg%3D)
NenoProbe Conductive
Our self-produced AFM probe with a conductive tip, capable of performing C-AFM, KPFM, PFM and I-V spectroscopy.
Measurement modes: C-AFM, KPFM, PFM, I-V spectroscopy
![PRSA](https://webadmin.nenovision.com/media/images/products/probe_prsa_adjusted_16x9.png?width=900&height=0&rmode=min&quality=75&token=K1vKRncMWNI3T2006wdTIdy6fZYlV5VSfskugOtufUg%3D)
Piezo-resistive probes
AFM probe suitable for both dynamic and contact mode topography measurements and F-Z spectroscopy.
Measurement modes: Topography, F-z spectroscopy
Are you interested? Feel free to...
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ZrN coating as a source for the synthesis of a new hybrid ceramic layer
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Advancements in graphene nanopatterning using focused electron-beam-induced etching
Researchers strive to unlock the potential of graphene, but precise manipulation remains challenging. In-situ experiments using the AFM-in-SEM LiteScope explore how electron-beam exposure affects SiO2 substrate morphology. Findings reveal subtle effects, guiding the optimization of nanopatterning processes for enhanced graphene-based device development.