Akiyama
The go-to probe for CPEM measurements thanks to its visible tip. Capable of measuring AFM topography and energy dissipation signal at the same time.
Measurement modes: Topography, Energy dissipation
NenoProbe Magnetic
Magnetic-sensitive probe based on the Akiyama sensor, that can be used in SEM thanks to its visible tip. It uses the same probe holder as regular Akiyama.
Measurement modes: Topography, MFM
NenoProbe Conductive
Our self-produced AFM probe with a conductive tip, capable of performing C-AFM, KPFM, PFM and I-V spectroscopy.
Measurement modes: C-AFM, KPFM, PFM, I-V spectroscopy
Piezo-resistive probes
AFM probe suitable for both dynamic and contact mode topography measurements and F-Z spectroscopy.
Measurement modes: Topography, F-z spectroscopy
Are you interested? Feel free to...
Unlocking the Secrets of Battery Materials: A Dive into AFM-in-SEM Characterization Webinar
Advancements in graphene nanopatterning using focused electron-beam-induced etching
Researchers strive to unlock the potential of graphene, but precise manipulation remains challenging. In-situ experiments using the AFM-in-SEM LiteScope explore how electron-beam exposure affects SiO2 substrate morphology. Findings reveal subtle effects, guiding the optimization of nanopatterning processes for enhanced graphene-based device development.
