LiteScope AFM probe in SEM

Technology for correlative microscopy

Learn about the principles & benefits of the correlative AFM-in-SEM measurements.

With our own research, development and manufacturing, we are listening to the scientific community and help to drive new discoveries with significant impact. The need to analyze and characterize objects from micro to nanoscale is growing, and the SEM and AFM techniques are the most common with an extensive user pool.

Ready to learn more about our unique correlative imaging technology?

"Next level of imaging" doesn't mean an empty phrase. Our unique imaging technology enables simultaneous acquisition of AFM and SEM data, which allows to undertake the sample analysis in a way that was difficult or impossible by the two imaging technologies separately. We are ready to drive new scientific discoveries!