Scientific articles with LiteScope measurements

The study investigates oxide nanoparticles (ONPs), specifically ZrO2 nanoparticles in Fe20Cr alloys, produced via laser powder bed fusion (PBF-LB/M), in order to understand how these nanoparticles impact the microstructure and mechanical properties. LiteScope was used for validating Electron Channeling Contrast Imaging (ECCI) findings and to distinguish nanoparticles (ONPs) from pores or preparation artifacts.

Researchers have developed a low-temperature plasma process to coat self-sensing AFM probes with boron-doped nanocrystalline diamond, boosting durability and sensitivity. This breakthrough enables precise electrical mapping of micro- and nanostructures in air and vacuum, advancing semiconductor technology.

Uncover the hidden effects of electron beam exposure on WS2 nanotubes and learn why understanding substrate charging is crucial for accurate prototyping and reliable device performance in next-generation electronics.

Ever wondered how improving thermoplastic starch with maltodextrin can enhance its preparation, morphology, rheology, and mechanical properties? Discover the effects and how these improvements lead to greater efficiency in both technical and biomedical applications.

Researchers used AFM-in-SEM LiteScope to develop a new method for measuring the surface roughness of spherical microparticles. By integrating AFM with SEM, LiteScope enabled quasi-3D roughness data, providing more detailed analysis than traditional 2D methods.

New Study Explores ZrN Coating as a Source for Hybrid Ceramic Layers with LiteScope Technology.