Scientific articles with LiteScope measurements

Browse the live testimonies of the scientific value of LiteScope: the research publications, where measurements made by our novel AFM-in-SEM were employed. Our library of articles shows strengths of in-situ microscopy and use of AFM-in-SEM solution.

See individual applications & results that our AFM-in-SEM brought to other researchers all around the globe and in different scientific fields. Each of the articles demonstrates the principal strengths of LiteScope and correlative imaging!

Find your research area and read the scientific articles of your interest!

Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites
Scientific articles | 17. 01. 2024 | by Ultramicroscopy

Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites

Discover the latest breakthroughs in researching the interface between biological organisms and nanomaterials. This article introduces a groundbreaking approach using AFM-in-SEM LiteScope, a novel combination of microscopic techniques, to unravel interaction mechanisms and effects. Dive into the microscopic realm for a concise exploration of this innovative methodology.

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Hematene: A sustainable 2D conductive platform for visible-light-driven photocatalytic ammonia decomposition
Scientific articles | 07. 08. 2023 | by Advanced Materials Today

Hematene: A sustainable 2D conductive platform for visible-light-driven photocatalytic ammonia decomposition

Researchers from Palacký University Olomouc and the Technical University of Ostrava have developed an eco-friendly method to make ultra-thin 2D hematene sheets, which could lead to better clean energy technology. All that with the assistance of our LiteScope.

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Scanning Probe Microscopy controller with advanced sampling support
Scientific articles | 11. 07. 2023 | by HardwareX

Scanning Probe Microscopy controller with advanced sampling support

In this new article, our colleagues together with members of the Czech Metrology Institute describe the Digital Signal Processor in detail.

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The AFM-in-SEM technique: True correlative sample analysis with the LiteScope
Scientific articles | 18. 06. 2023 | by Vacuum Technology & Coating

The AFM-in-SEM technique: True correlative sample analysis with the LiteScope

This new article describes how LiteScope combines multiple modes of AFM and SEM and how such approach to surface analysis can provide researchers with a significant amount of information about their materials.

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FEBID-grown magnetic tips tested with LiteScope in a new article
Scientific articles | 27. 04. 2023 | by Sensors

FEBID-grown magnetic tips tested with LiteScope in a new article

This new article investigates the durability of FEBID-grown magnetic tips for MFM measurements.

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Fate of Gold Nanoparticles in Laser Desorption/Ionization Mass Spectrometry
Scientific articles | 31. 03. 2023 | by Mass Spectrometry

Fate of Gold Nanoparticles in Laser Desorption/Ionization Mass Spectrometry

This article explains how a new technique called LDI MSI can show where nanoparticles are located on a surface. And of course, it happened with help of the correlative AFM-in-SEM measurements!

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