ISTFA 2024

We're excited to showcase our AFM-in-SEM LiteScope and its solutions at the International Symposium for Testing and Failure Analyses, at San Diego, CA, from October 28 to November 1, 2024. This event for the microelectronics failure analysis community is perfect  for sharing your insights, experiences, and expertise.

Visit us at booth 212, learn more about our applications, and discuss the perfect solution for you. During the conference, we will have a LIVE DEMO of AFM-in-SEM LiteScope. Stop by booth 212 anytime, or contact us to schedule a demo.

During ISTFA week, you’ll have the opportunity to see a LIVE demo of the AFM-in-SEM LiteScope at the nearby SAGE Analytical Lab. To schedule a time that works best for you, register using the button below.

Register for the ISTFA DEMO          Register for the Sage Lab DEMO

Presentation

Join us for an insightful presentation by Jan Neuman, CEO and Co-founder. Learn about the latest advancements in integrating AFM and SEM for comprehensive failure analysis.  The presentation Correlative Microscopy: In-Situ AFM-in-SEM Introduction, Capabilities, and Case Studies Semiconductor Materials and Batteries will explain correlative microscopy and In-situ AFM-in-SEM capabilities and workflow, as well as the AFM-in-SEM Applications in Semiconductor Devices and Batteries.

Speaker: Jan Neuman

Title: Correlative Microscopy: In-Situ AFM-in-SEM Introduction, Capabilities, and Case Studies Semiconductor Materials and Batteries

Date: Monday, October 28, 2024

Time: 9:00 AM

Place: ISTFA (Hilton San Diego Bayfront)

Our Team

Feel free to explore our team on LinkedIn and contact us at any time!

Jan Neuman, CEO

Rosalinda Ring, Director of Applications Development and Engineering, rosalinda.ring@nenovision.com

Alex Johnson, Business Development Manager

Ondřej Novotný, Development Engineer