Where to Meet NenoVision in 2026: Five Conferences Across Three Continents

The 2026 conference season takes NenoVision across Europe, Asia and North America. Over the course of the year, Marek Jemelka and Alex Johnson will be meeting customers and partners at five events spanning semiconductor research, failure analysis and electron microscopy. Each stop is a chance to talk through where AFM-in-SEM fits into real analytical workflows.

The 2026 lineup

The year opens in the UK and closes in China, with stops across the failure analysis and reliability calendar in between:

Semicon UK — 1–2 July, Sheffield, United Kingdom

IPFA 2026 — 13–16 July, Singapore

ESREF 2026 — 21–24 September, Vienna, Austria

ISTFA 2026 — 4–8 October, San Antonio, USA

CEMS 2026 — 16–20 October, Nanjing, China

For the failure analysis community, IPFA, ESREF and ISTFA need little introduction. They bring together the engineers and researchers who spend their days isolating defects, characterizing reliability and pushing analytical methods further. Semicon UK and CEMS round out the picture on the semiconductor research and electron microscopy side.

What to expect at our booth

At most of these events you'll find NenoVision at our distributors' booths, with a model of our AFM-in-SEM system on hand. The conversations there tend to start from a practical question: where would atomic force microscopy inside a scanning electron microscope actually help in your work?

That's the part worth coming for. AFM-in-SEM combines the navigation and imaging of an SEM with the quantitative surface, electrical and mechanical data of an AFM, in a single chamber, on the same spot of the sample. For some labs that means correlative measurements that were impractical before. For others it's a way to get electrical or topographical information that SEM alone can't provide. Which of those applies depends entirely on the samples and the questions, and that's exactly what Marek and Alex are there to figure out with you.

Come and talk to us

If your work touches failure analysis, materials science, battery research or semiconductor characterization, stop by. Come to discuss AFM-in-SEM with us, see where it could fit your application, and book a demo when the time is right.