NenoVision at M&M 2025, Booth #2136

Nenovision at Microscopy & Microanalysis conference 2025

We are thrilled to announce that NenoVision will participate in the prestigious M&M 2025 in Salt Lake City (July 27-31).

You can find us at booth #2136, located in the main exhibition hall. Come have a chat, so we can find out how LiteScope AFM-in-SEM can enhance your research: from semiconductor failure analysis to battery materials characterization! 

Vendor tutorial

The best way to get an in-depth understanding of the in-situ AFM-in-SEM solution is to sign up for our vendor tutorial held by Veronika Hegrová. 

Hosted at our booth on Tuesday (July 29) at 5:45-6:45, vendor tutorial is the perfect opportunity to discuss LiteScope, get a closer look at its features, and explore how it can support your specific application needs.

Spots are limited, so if you’re attending M&M, be sure to sign up soon and secure your spot for the tutorial ⬇️

Sign up

How to find us 

Nenovision Talks

In addition to the vendor tutorial hosted by Veronika, we’re proud to be part of two key talks on Wednesday:

🔵 Correlative AFM-in-SEM characterization of Next-gen Batteries

Session: P04.5 - Energy Materials: Transport Pathways, Interfaces, & Durability for Performance

Date & Time: Wednesday, July 30 (9:15 AM – 9:30 AM)

Speaker: Jan Kramář

🔵 In-situ workflow for electrical characterization of semiconducting structures using AFM-in-SEM technology

Session: A07.3 - Advances in SEM Instrumentation, Application, and Techniques

Date & Time: Wednesday, July 30 (2:00 PM – 2:15 PM)

Speaker: Veronika Hegrová

You can find the full M&M 2025 program HERE. 

Booth game

This year we have partnered up with other attending members of the In-situ Microscopy Alliance (DENSsolutions & point electronics GmbH) to prepare a fun quiz - visit all our booths to find all the questions and answer them for a chance to win some cool international prizes! 

So make sure to stop by at booth #2136 - let's connect at M&M 2025 in Salt Lake City!