Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM

Register now:

We’re running this webinar twice for our global audience - pick whichever timeslot fits your schedule the best!

       Register - May 13                                                      Register - May 28

In this webinar, you will learn how to:

• Navigate directly to specific vias, transistors, or doped layers and perform localized electrical characterization.
  

• Eliminate sample transfers with an integrated SEM, FIB, and AFM in-situ workflow.

• Streamline diagnostics of device failures at the nanoscale level to speed up your R&D process.

• Use LiteScope in real-world cases like dopant profiling of MOSFET transistors and conductivity mapping of complex semiconductor structures.

Speaker: