Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM

Dive into the world of semiconductor failure analysis and discover how integrated AFM-in-SEM technology enables in-situ, high-resolution electrical and topographical characterization - right where it matters most.
Learn how LiteScope transforms traditional workflows by combining SEM, FIB, and AFM techniques into a single, efficient process - streamlining diagnostics and revealing the root causes of device failure with nanoscale precision.
This webinar will walk you through real application examples, including dopant profiling of MOSFET transistors and conductivity mapping of complex semiconductor structures.
Webinar
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16. 04. 2025
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by Lea Olekšáková
Semiconductors
Product