Invitation to Seminar of Fraunhofer Cluster

Combining scanning electron microscopy (SEM) and atomic force microscopy (AFM by integrating compact AFM into SEM brings novel possibilities for true correlative microscopy and advanced multi-modal sample characterization that would be often unfeasible using each modality separately. 

What are the specific benefits of combining these technologies? You will learn this at the seminar!

The seminar is scheduled for Thursday 25th June 2020, from 15:00 - 17:00 via Microsoft Teams. If you are interested don't forget to send an email to info@nenovision.com. You will be provided the MS Teams link.