Join our virtual lecture at conference EM 2020!

Our Senior Application Engineer Josef Horák will be having a presentation on the Novel approach to correlative microscopy using AFM-in-SEM and CPEM technology. The lecture starts at 15:15 December 2nd.

The online conference will provide a platform for electron microscopists, crystallographers, materials scientists, and solid state physicists to discuss methods and techniques used in electron microscopy. Join us virtually and explore the benefits we can bring to your research. Contact us for more information at application@nenovision.com.

See you there!

More information about the event can be found here: Conference on Electron Microscopy