NenoVision

-

Learn more about the LiteScope 2.5 in the fresh article: AFM meets SEM

Learn more about the LiteScope 2.5 in the fresh article: AFM meets SEM

Learn more about the LiteScope 2.5 in the fresh article: AFM meets SEM

"With its latest AFM-in-SEM tool, LiteScope 2.5, NenoVision aims to take in-situ correlative microscopy to new heights. Jan Neuman, chief executive and co-founder, explains how."

In this interview, our CEO Jan Neuman reveals some facts about NenoVision in general as well as about our product LiteScope which has recently been upgraded into the 2.5 version. You can read about the upgrade and discover the ways in which LiteScope can benefit your research here: AFM meets SEM.

Publication | 30. 06. 2023 | by Patrik Maňas

Product Technology

Related posts

IKTS Workshop

Event | 23. 07. 2025 | by Jana Levá

IKTS Workshop

Product Technology

NenoVision at M&M 2025, Booth #2136

Event | 17. 07. 2025 | by Sabina Žilková

NenoVision at M&M 2025, Booth #2136

Product Technology

In-Situ SEM Masterclass at QUT University!

| 06. 01. 2025 | by Lea Olekšáková

In-Situ SEM Masterclass at QUT University!

Material Science Technology

Upcoming Battery Webinar | Unveiling Battery Electrode Secrets with AFM-in-SEM

Webinar | 02. 01. 2025 | by Lea Olekšáková

Upcoming Battery Webinar | Unveiling Battery Electrode Secrets with AFM-in-SEM

Semiconductors Technology

Asia Pacific Microscopy Congress 2025 (APMC 2025)

Event | 19. 12. 2024 | by Lea Olekšáková

Asia Pacific Microscopy Congress 2025 (APMC 2025)

Material Science Technology