New application note: Analysis of FIB etched nanostructures
We are happy to inform you that we have prepared a new application note for you. Its name is In-situ AFM analysis of FIB etched nanostructures. Read about the key LiteScope™ advantages for FIB applications!
Publication | 14. 11. 2019 | by Markéta Eliášová
Publication | 14. 09. 2023 | by Patrik Maňas
"In-situ nanoindentation and AFM within your SEM" in the AMMS Newsletter
Publication | 07. 08. 2023 | by Patrik Maňas
Green Synthesis of 2D Hematene with the Help of LiteScope
Semiconductors Product Technology
Publication | 11. 07. 2023 | by Patrik Maňas
An article describing the latest technological features of LiteScope is out!
Publication | 30. 06. 2023 | by Patrik Maňas
Learn more about the LiteScope 2.5 in the fresh article: AFM meets SEM
Publication | 18. 06. 2023 | by Patrik Maňas
The AFM-in-SEM technique: True correlative sample analysis with the LiteScope
Material Science Technology