New application note: Analysis of FIB etched nanostructures

We are happy to inform you that we have prepared a new application note for you. Its name is In-situ AFM analysis of FIB etched nanostructures. Read about the key LiteScope™ advantages for FIB applications!
Publication
|
14. 11. 2019
|
by Markéta Eliášová
Nanostructures
Related posts

Publication
|
14. 09. 2023
|
by Patrik Maňas
"In-situ nanoindentation and AFM within your SEM" in the AMMS Newsletter
Product
Technology

Publication
|
07. 08. 2023
|
by Patrik Maňas
Green Synthesis of 2D Hematene with the Help of LiteScope
Semiconductors
Product
Technology

Publication
|
11. 07. 2023
|
by Patrik Maňas
An article describing the latest technological features of LiteScope is out!
Product
Technology

Publication
|
30. 06. 2023
|
by Patrik Maňas
Learn more about the LiteScope 2.5 in the fresh article: AFM meets SEM
Product
Technology

Publication
|
18. 06. 2023
|
by Patrik Maňas
The AFM-in-SEM technique: True correlative sample analysis with the LiteScope
Material Science
Technology