NenoVision Support Center is a place where you find all the materials that explain the benefits of LiteScope and correlative microscopy.
LiteScope™ is a unique Atomic Force Microscope (AFM) designed for „plug & play“ integration into the Scanning Electron Microscopes (SEMs). It combines the best of the two of the most used techniques for nanoscale analyses. LiteScope provides effortless SEM and AFM correlation.
The Correlative Probe and Electron Microscopy, shortly CPEM, is a novel method of multidimensional correlative imaging, enabling simultaneous acquisition of data of the scanning electron microscope and atomic force microscope, that can be easily correlated into a 3D image. It eliminates the need for double localization of the region of interest, enables highly precise imaging and alignment, and advanced data correlation.
Did you know that there is a large number of applications for which 2D nanomaterials are very promising? The analysis of such structures can be challenging due to the size, thickness, and poor SEM contrast of the thin layers. Our AFM-in-SEM LiteScope represents the best possible solution on how to deal with all these issues.
LiteScope is an AFM microscope designed for fast and easy (plug-and-play) integration within SEM instruments. It allows you to get precise in-time image correlation without limiting the imaging options of either system. On top of that, it enables user-friendly operation and easy remote access.
Check the new accessory we have developed to improve measurement workflow and user experience with our microscope. Load-lock mechanism provides the possibility of loading samples and probes into LiteScope using a standard SEM Air-lock/Load-lock sample transfer system.
In NenoVision, we convert science into commercial products. Because we think science has the power to make our world a safer, more efficient, and more sustainable place to live.
Thanks to CEITEC, we have a strong partner on our path to the global market.
Meet NenoVision and its unique miscroscope LiteScope™ which was developed for integration into the scanning electron microscopes. The company was awarded Seal of Excellence that confirms the quality on the European market.