Reference Laboratory for Correlative Microscopy Grand Opening

To register for the event, please visit https://tacom.fel.cvut.cz/, where the registration form is visibly listed.

Event schedule:

• 9:30 – 10:00 Registration of attendees, morning coffee
• 10:00 – 11:30 Introductory talks
• 11:30 – 13:00 Grand opening with buffet
• 13:00 – 15:00 Discussion, detailed measurement demonstration, measurements for individual attendees

"Correlative microscopy combining AFM and SEM takes advantage of both methods to obtain a more comprehensive view of the examined sample. Using Atomic Force Microscopy (AFM), we can get a very accurate 3D map of the surface height profile and other information in advanced modes of AFM. Scanning Electron Microscopy (SEM) provides us with a quick insight into the surface morphology and additional information about the sample's local electronic properties and composition, including the chemical groups on the surface. At the same time, it helps us find an area suitable for detailed examination more quickly. Both devices then scan the selected area at the same time (and therefore under the same conditions), and the result is complex correlated data that maps the various properties of the given part of the sample and makes their interrelationships visible."

To learn more about Correlative microscopy and our unique technology CPEM (Correlative Probe & Electron Microscopy), you can read through our website or contact our team of friendly experts, who will happily answer all your questions!

The project is co-financed by the Technology Agency of the Czech Republic.