FEBID-grown magnetic tips tested with LiteScope in a new article
This new article investigates the durability of FEBID-grown magnetic tips for MFM measurements.
The article reports on a study of the durability of magnetic tips grown using a nanolithography technology called Focused Electron Beam Induced Deposition (FEBID). These magnetic tips offer several advantages over commercial ones in Magnetic Force Microscopy (MFM) due to their high aspect ratio and good magnetic behaviour. The study subjected a batch of FEBID-grown magnetic tips to a systematic analysis of MFM magnetic contrast for 30 weeks, using magnetic storage tape as a test specimen.
The findings suggest that FEBID magnetic tips are good candidates for high-resolution MFM measurements, providing a reliable and long-lasting option for simultaneous topographical and magnetic measurements. To get complete and more detailed information, feel free to read the whole article which you can reach via the button below.