LiteScope Contributes to Study on Creep Behavior and Microstructure Evolution in Advanced Alloys

In this study ("Role of grain boundary sliding in creep of FCC complex solid solutions"), researchers employed a wide range of electron microscopy methods to analyze alloy microstructures before and after creep testing. The experimental setup included two Tescan LYRA FIB-SEMs, both equipped with EDS and EBSD detectors. Importantly, the LiteScope AFM-in-SEM was integrated into one of the SEMs, enabling correlative measurements that combined standard SEM imaging with high-resolution AFM surface profiling. This approach allowed the team to simultaneously observe grain structures while acquiring precise topographical data, thereby enriching their understanding of alloy creep mechanisms.

We would like to congratulate the authors, including our colleagues from the Institute of Physics of Materials of the Czech Academy of Sciences, on this important contribution to materials science, and we are proud that LiteScope AFM-in-SEM technology could support their research.

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