The AFM-in-SEM technique: True correlative sample analysis with the LiteScope
This new article describes how LiteScope combines multiple modes of AFM and SEM and how such approach to surface analysis can provide researchers with a significant amount of information about their materials.
The article was created in collaboration of our dear NenoVision colleagues together with professor Matthew Linford from the Brigham Young University.
Discover the ways in which LiteScope revolutionises how we observe and analyse nanoscale structures, providing unprecedented clarity and precision by combining SEM and AFM imaging. The article dives deep into the innovative features, CPEM technology and showcases its potential impact in various industries ranging from material science to batteries research.