Sample rotation module for LiteScope released

The sample rotation option for LiteScope deals with some of the past limitations that were present in the AFM-in-SEM solution:

• enables measurement of several samples at the same time, without opening the SEM chamber and losing the vacuum
  
• offers a considerably larger sample area for samples of unusual size
  
• allows appropriate sample orientation for FIB milling and immediate AFM analysis
  

For researchers who need to analyse atypically shaped samples (mineralogy, cross-section analysis…), perform FIB optimisation or FIB lamellae preparation combined with AFM analysis, or other possible applications, we happily present our solution.