Read the opinions of our customers and colleagues in the fields of material science, nanostructures, semiconductors, life sciences, and more.
We implement the AFM in SEM technology in the field of the low dimensional materials research. The correlative AFM in SEM microscopy embodied in LiteScope opens up a brand new dimension of knowledge about these materials' properties and their optimization.
I would like to thank for the assistance that I am receiving at NenoVision for the development of my research. The extraordinary level of expertise and scientific knowledge that I found there is fundamental for my project and the high quality of the imaging obtained with LiteScope has produced outstanding results so far. I hope to keep continuing my collaboration with NenoVision also in the future.
LiteScope™ is a true extension of horizons in the field of material engineering and semiconductors. I appreciate the innovative approach of its creators who were not afraid to look at AFM technology from a different perspective. I am honored that our institute has a serial number 01.
We have greatly appreciated every aspect of our collaboration with NenoVision. Our communication has been smooth, efficient, and informative. By utilizing their novel CPEM technology, NenoVision helped us gain unique 3D information about our nano-sized samples deposited on cm-sized substrates. The unique ability to utilize both SEM and AFM at the same time allowed us to directly correlate the size and mechanical properties of silk nanowires. We truly appreciated all the assistance we received from NenoVision and hope to continue this fruitful collaboration in the future.
Using LiteScope's technique allowed us to describe the formation of blisters on the surface of highly oriented pyrolytic graphite during the atomic layer deposition process. Easy localization of the area of interest using the SEM and following local characterization of the surface by the AFM provided us with topographical information about blistered features and their behavior in a vacuum and in air. Special thanks go to the specialists from NenoVision for the consultation, help, and training.
LiteScope opens new ways for inspection of nanoscale processes inside an electron microscope. We envision utilizing LiteScope together with our custom-built reactors for the evaluation of 2D materials' properties without transfer or exposure to atmospheric conditions.
I have had the pleasure of working with the NenoVision team. Application of their unique imaging technology, i.e. the Correlative Probe and Electron Microscopy (CPEM), enables us to progress our research in the field of characterization of the secondary phases in advanced high strength steels and provides a novel insight into multiphase steels structures. The CPEM technique is a powerful tool for the investigation of complex steels and opens the door to a better understanding of the structure-mechanical properties relationship. I with full confidence recommend NenoVision as a professional and reliable research partner.
NenoVision is a good example of bringing together academic and business spheres. The unique idea of students has been transformed into a world patent LiteScope that has the chance to disturb the waters of nanoscience. It is pleasing to use the knowledge gained through this invention in international projects.
SEM and AFM are two basic and irreplaceable characterization techniques for material science. Thanks to the combination of them in LiteScope our work is more precise and much faster. Moreover, cooperation with our friends from NenoVision is pure pleasure! LiteScope represents the two most important features of science: optimization and close partnership.
In my research, LiteScope more intuitively reflected the 3D surface morphology of the composite film. In addition, if the characterization of the morphology and electrical properties of the composite films will be combined and measured at the same time, it will bring a more convenient solution for solar cells related research.
Our cooperation with NenoVision in the field of carbon analysis leads to interesting results in the structural observation of our carbon substance. After discussing our progress in the analytical detection, Mrs. Hegrová suggested complementation of our measurements, thus contributing highly to the increase of our knowledge in the field. Also, the attitude of Dr. Neuman is highly professional not only in the field of carbon analysis we are now dealing with in our university research. We would like to thank NenoVision for the positive attitude we have encountered when dealing with all staff of the company.
NenoVision with their LiteScope are among the most successful startups that have gone through the South Moravian Innovation Center. For our trust in this project, we decided to invest in NenoVision.
The Czech Republic is the world's leading country at the field of electron microscopy. I am very pleased that the LiteScope™ device, which significantly extends the possibilities of using these microscopes, is also a unique Czech invention.
The unique combination of correlative AFM and SEM imaging of the same area at the same time enables effective and convenient imaging of both the 3D surface relief and the visual contrast. We especially appreciated LiteScope´s technique in case of the detailed analysis of plastic strains and fatigue cracks on the surface of cyclically strained superalloys.
The correlative AFM and SEM imaging enabled us to easily identify graphene nanoribbons on nonpolar meso structures of SiC. Although we could measure the topography using a stand-alone AFM, we would not be able to localize the graphene nanoribbon. While the SEM imaging enables us to identify the presence of the graphene ribbon from the changes in the surface conductivity, the AFM is used to localize the area of the SiC terrace where the ribbon was formed. Merging of the AFM and SEM techniques enables us to reliably localize the nanoribbons and to estimate the optimal growth conditions.
The integration of LiteScope into the scanning electron microscope enables us to precisely characterize the topography of areas invisible to the human eye or to the light microscopes. The correlation of the AFM and SEM signals acquired simultaneously in the same area enabled us to identify the relationship between extensive defects in III-Nitride semiconductors and their conductivity.