Conductivity analysis of Si nanopillars

Silicon-based nanopillars are of high interest in photovoltaics, biosensing and many other applications where their conductivity plays an important role. As an example, a cross-section of a nanopillar array with variable conductivity was investigated by AFM, C-AFM and SEM.
The SEM helped easily find the region of interest of nanopillars with further study of their electrical conductivity properties by means of the C-AFM technique.
Measurement modes: C-AFM, Topography
LiteScope benefits:
- easy structure localisation and tip navigation
- multimodal analysis utilising SEM, C-AFM, and AFM techniques providing local current mapping, electronic defects, and electric properties in dependence on the surface morphology
Sample courtesy of Jan Kristen Prüßing, University of Münster
See also
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