Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.


SEM integration

The LiteScope™ is designed for integration to SEM microscopes from different manufacturers in the “Plug & Play” mode. We provide appropriate adapters and feedthroughs that can be customized to client requirements.

The LiteScope™ is simple to attach to an electron microscope by four screws to the sample stage, the electrical cables are plugged into prepared vacuum feedthrough.