Atomic Force Microscope designed for easy integration into the Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques enables you to use the advantages of both commonly used microscopy techniques.
LiteScope is designed for fast and easy integration to SEM microscopes from different manufacturers in the “Plug & Play” mode. We provide appropriate adapters and feed-throughs that can be customized to client requirements.
LiteScope is simple to attach to an electron microscope by four screws to the sample stage, the electrical cables are plugged into prepared vacuum feedthrough. The integration takes just a few minutes.
Thanks to its unique design LiteScope is compatible with commercial probes and most SEMs produced by Hitachi, Jeol, TESCAN, Thermo Fisher Scientific, and ZEISS.