Advanced techniques in correlative AFM-in-SEM measurements

Learn more about MFM, KPFM and C-AFM measurements in AFM-in-SEM with a webinar that took place on the 2nd of September 2021. In the first part, the Head application engineer of NenoVision, Veronika Hegrová, spoke about Magnetic and electric techniques in correlative AFM-in-SEM measurements made by LiteScope™, the second part, given by Radek Dao, Application engineer of NenoVision, consists of practical measurement demonstration.